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Featured researches published by Nobuo Tsumaki.


Wear | 1991

Transitions of microscopic wear mechanism for Cr2O3 ceramic coatings during repeated sliding observed in a scanning électron microscope tribosystem

Hiroyuki Kitsunai; Kazuo Hokkirigawa; Nobuo Tsumaki; Koji Kato

Abstract The purpose of this investigation is to analyse microscopic wear modes and their transitions for Cr 2 O 3 coatings in repeated sliding. For this purpose the wear processes during 100 sliding cycles were observed successively in a scanning electron microscope tribosystem. They were also compared with those of a metal, SUS304 stainless steel. The type of wear test was pin on disc. Cr 2 O 3 coatings on SUS304 stainless steel were used for the disc specimens. The thickness of the coatings was 400 μm. The pin specimen was made of single-crystal diamond with a hemispherical tip of radius 30 μm. The sliding velocity was 400 μm s −1 . The normal load was changed from 0.07 to 1.5 N. The following results were obtained. 1. (1) The wear modes are classified into crack and powder formation, flake formation and ploughing and powder formation. These wear modes are mainly caused by surface crack propagation. 2. (2) The wear modes change during repeated sliding as follows for loads from 0.2 to 1.5 N: crack and powder formation (low wear rate)→flake formation (high wear rate)→ploughing and powder formation (negligible wear rate). When W =0.07 N , the wear mode is ploughing and powder formation and there is no transition to other wear modes. 3. (3) The condition for wear mode transition can be explained theoretically by using the parameter of severity of contact, S c , and the friction coefficient μ, where S c = P max ( R max ) 1 2 /K Ic .


Journal of the Acoustical Society of America | 1987

Vibration-controlling bearing

Hideki Izumi; Nobuo Tsumaki; Kazuo Ihara

A vibration-controlling bearing for controlling vibration developing in a rotary shaft supported in a housing of a rotary machine including a bearing member of a cylindrical shape interposed between an outer peripheral surface of the rotary shaft and an inner peripheral surface of the housing and spaced apart therefrom by respective gaps. A dynamic pressure is generated between an inner peripheral surface of the bearing member and the outer peripheral surface of the rotary shaft. Communicating ducts are formed in the bearing member for transmitting a portion of the dynamic pressure generated to a gap between the outer peripheral surface of the bearing member and the inner peripheral surface of the housing.


Journal of The Electrochemical Society | 1999

In Situ Infrared Reflection Absorption Spectroscopy of Materials Formed on SiO2 in Inductively Coupled Plasma Etching Chamber

Hiroki Kawada; Hiroyuki Kitsunai; Nobuo Tsumaki

In situ infrared reflection absorption (IRA) spectroscopy was used to investigate materials formed on SiO 2 film coated on samples mounted on the inner surface of a process chamber for inductively coupled plasma etching. Aluminum wafers partially covered with photoresist film were etched using BCl 3 and Cl 2 plasma generated in a quartz chamber surrounded by a radio frequency (rf) coil. RF bias was applied to the aluminum wafers at the same time. This is the first time that, in order to predict the IRA spectra, the reflectivities of various inorganic multiple layers formed on metal substrates have been calculated using the optical constants of the materials. The experimental spectra for SiO 2 film and for the materials formed on it during a 2 μm deep etching process were well characterized by the calculated spectra of SiO 2 film and a B 2 O 3 layer on it, respectively.


Archive | 2001

Remote diagnostic system and method for semiconductor manufacturing equipment

Kazue Takahashi; Nobuo Tsumaki; Hideyuki Yamamoto


Archive | 1988

Apparatus for holding and/or conveying articles by fluid

Hiromitsu Tokisue; Nobuo Tsumaki; Toshifumi Koike


Archive | 1991

Holder device and semiconductor producing apparatus having same

Hiromitsu Tokisue; Hiroyuki Kitsunai; Nobuo Tsumaki; Hiroshi Inouye


Archive | 2001

Remote diagnosing system for semiconductor manufacturing equipment and a remote diagnosing method

Kazue Takahashi; Nobuo Tsumaki; Hideyuki Yamamoto


Archive | 1989

Method of supplying lubricant and apparatus for the same

Muneo Mizumoto; Koji Kato; Hiroshi Inoue; Nobuo Tsumaki


Archive | 1998

Plasma treatment method and manufacturing method of semiconductor device

Hiroyuki Kitsunai; Nobuo Tsumaki; Shigeru Kakuta; Kazuo Nojiri; Kazue Takahashi


Archive | 1997

Semiconductor manufacturing apparatus with foreign matter removal function

Hiroyuki Kitsunai; Azusa Shimamura; Nobuo Tsumaki; 伸夫 妻木; あずさ 島村; 浩之 橘内

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