Nodari Sitchinava

Fundamental parallel algorithms for private-cache chip multiprocessors

In this paper, we study parallel algorithms for private-cache chip multiprocessors (CMPs), focusing on methods for foundational problems that are scalable with the number of cores. By focusing on private-cache CMPs, we show that we can design efficient algorithms that need no additional assumptions about the way cores are interconnected, for we assume that all inter-processor communication occurs through the memory hierarchy. We study several fundamental problems, including prefix sums, selection, and sorting, which often form the building blocks of other parallel algorithms. Indeed, we present two sorting algorithms, a distribution sort and a mergesort. Our algorithms are asymptotically optimal in terms of parallel cache accesses and space complexity under reasonable assumptions about the relationships between the number of processors, the size of memory, and the size of cache blocks. In addition, we study sorting lower bounds in a computational model, which we call the parallel external-memory (PEM) model, that formalizes the essential properties of our algorithms for private-cache CMPs.

A reconfigurable shared scan-in architecture

In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) architecture is defined. The composite architecture is created with analysis that relies on the compatibility relation of scan chains. Topological analysis and compatibility analysis are used to maximize gains in test data volume and test application time. The goal of the proposed synthesis procedure is to test all detectable faults in broadcast test mode using minimum scan-chain configurations. As a result, more aggressive sharing of scan inputs can be applied for test data volume and test application time reduction. The experimental results demonstrate the efficiency of the proposed architecture for real-industrial circuits.

Sorting, searching, and simulation in the mapreduce framework

We study the MapReduce framework from an algorithmic standpoint, providing a generalization of the previous algorithmic models for MapReduce. We present optimal solutions for the fundamental problems of all-prefix-sums, sorting and multi-searching. Additionally, we design optimal simulations of the the well-established PRAM and BSP models in MapReduce, immediately resulting in optimal solutions to the problems of computing fixed-dimensional linear programming and 2-D and 3-D convex hulls.

Changing the scan enable during shift

This paper extends the reconfigurable shared scan-in architecture (RSSA) to provide additional ability to change values on the scan configuration signals (scan enable signals) during the scan operation on a per-shift basis. We show that the extra flexibility of reconfiguring the scan chains every shift cycle reduces the number of different configurations required by RSSA while keeping test coverage the same. In addition a simpler analysis can be used to construct the scan chains. This is the first paper of its kind that treats the scan enable signal as a test data signal during the scan operation of a test pattern. Results are presented on some ISCAS as well as industrial circuits.

Parallel external memory graph algorithms

In this paper, we study parallel I/O efficient graph algorithms in the Parallel External Memory (PEM) model, one o f the private-cache chip multiprocessor (CMP) models. We study the fundamental problem of list ranking which leads to efficient solutions to problems on trees, such as computing lowest common ancestors, tree contraction and expression tree evaluation. We also study the problems of computing the connected and biconnected components of a graph, minimum spanning tree of a connected graph and ear decomposition of a biconnected graph. All our solutions on a P-processor PEM model provide an optimal speedup of Θ(P) in parallel I/O complexity and parallel computation time, compared to the single-processor external memory counterparts.

Dynamic scan: driving down the cost of test

Two factors primarily drive the soaring cost of semiconductor test: the number of test patterns applied to each chip and the time it takes to run each pattern. Typical semiconductor testing for each chip involves a set of 1,000 to 5,000 test patterns. These tests are applied through scan chains that operate at about 25 MHz. Depending on the size of the scan chains on the chip, a set of test patterns can take a few seconds to execute per chip. Its easy to see that even a small decrease in either the number of patterns or the time to execute them can quickly add up to big savings across millions of fabricated chips. This potential savings forms the basis for dynamic scan, a new approach to the well-established scan test methodology. The authors initial studies indicate that dynamic scan could easily reduce the time spent applying test patterns by 40 percent. A more theoretical analysis shows a potential savings of as much as 80 percent.

Geometric algorithms for private-cache chip multiprocessors

We study techniques for obtaining efficient algorithms for geometric problems on private-cache chip multiprocessors. We show how to obtain optimal algorithms for interval stabbing counting, 1-D range counting, weighted 2-D dominance counting, and for computing 3-D maxima, 2-D lower envelopes, and 2-D convex hulls. These results are obtained by analyzing adaptations of either the PEM merge sort algorithm or PRAM algorithms. For the second group of problems—orthogonal line segment intersection reporting, batched range reporting, and related problems—more effort is required. What distinguishes these problems from the ones in the previous group is the variable output size, which requires I/O-efficient load balancing strategies based on the contribution of the individual input elements to the output size. To obtain nearly optimal algorithms for these problems, we introduce a parallel distribution sweeping technique inspired by its sequential counterpart.

Efficient parallel and external matching

We study a simple parallel algorithm for computing matchings in a graph. A variant for unweighted graphs finds a maximal matching using linear expected work and

A parallel buffer tree

{\mathcal O}{\log^2 n}

On (dynamic) range minimum queries in external memory

expected running time in the CREW PRAM model. Similar results also apply to External Memory, MapReduce and distributed memory models. In the maximum weight case the algorithm guarantees a 1/2-approximation. Although the parallel execution time is linear for worst case weights, an experimental evaluation indicates good scalabilty on distributed memory machines and on GPUs. Furthermore, the solution quality is very good in practice.