Norbert Czarnetzki
Carl Zeiss AG
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Publication
Featured researches published by Norbert Czarnetzki.
Space Optics 1994: Space Instrumentation and Spacecraft Optics | 1994
Jakob Neubert; Thomas Seifert; Norbert Czarnetzki; Thomas Weigel
The ARS-scatterometer at the IOF Jena which has been designed and built in cooperation with the Carl Zeiss JENA GmbH is capable of performing accurate measurements of the BRDF over a range of approximately eleven orders of magnitude (from 105 to 10-6 sr-1) in BRDF. These measurements can be carried out for surfaces made of any dielectric, metallic or semiconductor material. A He-Ne-laser is used in conjunction with a mirror beam focusing optics. The eight motorized degrees of freedom of the instruments are computer controlled and interfaced to the user by a sophisticated software running under MicroSoft Windows. It is shown, that the scatterometer is sensitive to a rms-roughness better than 1 nm.
Archive | 2001
Eberhard Derndinger; Norbert Czarnetzki; Peter Ott; Thomas Scherübl
Archive | 1998
Thomas Scheruebl; Norbert Czarnetzki
Archive | 1998
Norbert Czarnetzki; Eberhard Derndinger; Peter Ott; Thomas Scherübl
Archive | 1998
Thomas Scheruebl; Norbert Czarnetzki
Archive | 1999
Norbert Czarnetzki; Peter Muehlig
Archive | 2001
Norbert Czarnetzki; Thomas Scheruebl; Stefan Mack; Eckard Hagemann; Toshiro Kurosawa
Archive | 2002
Norbert Czarnetzki; Thomas Scheruebl; Stefan Mack; Toshiro Kurosawa; Eckhard Hagemann
Archive | 2001
Norbert Czarnetzki; Thomas Scheruebl
Archive | 2001
Norbert Czarnetzki; Thomas Scheruebl; Stefan Mack; Toshiro Kurosawa