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Dive into the research topics where Norikazu Ito is active.

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Featured researches published by Norikazu Ito.


Japanese Journal of Applied Physics | 2004

Improved External Efficiency InGaN-Based Light-Emitting Diodes with Transparent Conductive Ga-Doped ZnO as p-Electrodes

Ken Nakahara; Kentaro Tamura; Mitsuhiko Sakai; Daisuke Nakagawa; Norikazu Ito; Masayuki Sonobe; Hidemi Takasu; Hitoshi Tampo; Paul Fons; Koji Matsubara; Kakuya Iwata; Akimasa Yamada; Shigeru Niki

Transparent conductive Ga-doped ZnO (ZnO:Ga) was fabricated to serve as p-contacts of InGaN-based light-emitting diodes (LEDs) using molecular-beam epitaxy. As-grown ZnO:Ga films typically have resistivities of ?=2-4?10-4 ??cm, and over 80% transparency in the near UV and visible wavelength ranges. The current-voltage characteristics between as-grown ZnO:Ga contacts and p-GaN layers were ohmic. The brightness of LEDs fabricated with ZnO:Ga p-contacts was nearly double compared to LEDs with conventional Ni/Au p-contacts. We obtained the external efficiency as high as 20.8% in the case of the near UV LED. The forward voltage at 20 mA was found not to increase even after the lamp LED with ZnO:Ga were kept for 80 h in high humidity and high temperature environments.


IEEE Electron Device Letters | 2013

Recessed-Gate Enhancement-Mode GaN MOSFETs With a Double-Insulator Gate Providing 10-MHz Switching Operation

Junichi Kashiwagi; Tetsuya Fujiwara; Minoru Akutsu; Norikazu Ito; Kentaro Chikamatsu; Ken Nakahara

Recessed-gate GaN metal-oxide-semiconductor field-effect transistors with a double-insulator gate configuration demonstrate 10-MHz switching operation of which delay time is <;35 ns. The recess structure is fabricated by etching the Al0.19Ga0.81N layers to expose their underlying AlN layers. The devices include a thermally oxidized AlN layer onto which an Al2O3 film is formed by atomic layer deposition, which works as a gate insulator. This structure performs enhancement-mode operation with a typical threshold voltage of 1.4 V. A maximum drain current of 158.3 mA/mm is achieved at 6 V gate bias and maximum transconductance is 52.1 mS/mm at 10 V drain bias.


Japanese Journal of Applied Physics | 2006

Microcrystalline Silicon Solar Cells Fabricated using Array-Antenna-Type Very High Frequency Plasma-Enhanced Chemical Vapor Deposition System

Tomoko Takagi; Masashi Ueda; Norikazu Ito; Yoshimi Watabe; Michio Kondo

An array-antenna-type very high frequency plasma-enhanced chemical vapor deposition (VHF-PECVD) system based on a multisubstrate deposition technique has been developed for the large area (>1 m2), high-throughput and low-cost production of thin-film silicon solar cells. A hydrogenated microcrystalline silicon ( µc-Si:H) solar cell fabricated at around 20 Pa showed an initial efficiency of 7.44% for a deposition rate of 0.32 nm/s with evaporated Ag as the back contact. The uniform formation of each layer was observed, and the quantum efficiency spectrum after exposure to air indicates high-stability high-quality film formation. The advantage of the novel array antenna method is discussed in terms of the material property as well as production cost.


Japanese Journal of Applied Physics | 2001

Optical Gain and Optical Internal Loss of GaN-Based Laser Diodes Measured by Variable Stripe Length Method with Laser Processing

Yoshinori Kimura; Atsuya Ito; Mamoru Miyachi; Hirokazu Takahashi; Atsushi Watanabe; Hiroyuki Ota; Norikazu Ito; Tetsuhiro Tanabe; Masayuki Sonobe; Kiyofumi Chikuma

We demonstrate a new technique for the variable stripe length (VSL) method by which the optical gain and optical internal loss of GaN-based laser diodes (LDs) can be directly measured. In the technique, the laser processing is utilized for varying the excitation length. The excitation length of GaN-based LDs can be varied by directly processing its p-electrode with high-power laser irradiation. From the results of the measurements, it was revealed that the optical internal loss of GaN-based LDs was strongly affected by the layer structure.


international meeting for future of electron devices, kansai | 2013

A 13.56 MHz wireless power transmission systems with enhancement-mode GaN high electron mobility transistors

Yusuke Nakakohara; Junichi Kashiwagi; Tetsuya Fujiwara; Minoru Akutsu; Norikazu Ito; Kentaro Chikamatsu; Astushi Yamaguchi; Ken Nakahara

Enhancement-mode GaN-HEMT devices with a newly developed recessed-gate structure were fabricated. These devices were capable of operating at up to 30 MHz switching. A wireless power transmission (WPT) was adopted for a potential application of these GaN devices, because high-frequency (f) switching devices are expected to improve the power-transfer efficiency (η) of the WPT. A GaN-based E-class amplifier WPT system achieved 10W output power and η =63.5 % under the operating conditions of f =13.56 MHz, duty=50%, and a load resistance of 10Ω.


Archive | 2004

Nitride-based semiconductor device

Masayuki Sonobe; Norikazu Ito; Kazuaki Tsutsumi; Tetsuya Fujiwara


Archive | 2000

Manufacture of semiconductor light emitting element

Norikazu Ito; Shunji Nakada; Yukio Shakuda; Masayuki Sonobe; Takeshi Tsutsui; 俊次 中田; 範和 伊藤; 雅之 園部; 幸男 尺田; 毅 筒井


Archive | 2001

Semiconductor light emitting device and semiconductor laser

Tetsuhiro Tanabe; Norikazu Ito


Archive | 2002

Nitride semiconductor device and method for manufacturing the same

Hiroyuki Ota; Masayuki Sonobe; Norikazu Ito; Tetsuo Fujii


Archive | 2003

Method and apparatus for forming thin films, method for manufacturing solar cell, and solar cell

Masashi Ueda; Tomoko Takagi; Norikazu Ito

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Tomoko Takagi

Tokyo Institute of Technology

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Hiroyuki Ota

National Institute of Advanced Industrial Science and Technology

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