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Dive into the research topics where Noriyuki Kataoka is active.

Publication


Featured researches published by Noriyuki Kataoka.


Journal of Electron Spectroscopy and Related Phenomena | 2016

Reproducibility of XPS analysis for film thickness of SiO2/Si by active Shirley method

Ryo Matsumoto; Yugo Nishizawa; Noriyuki Kataoka; Hiromi Tanaka; Hideki Yoshikawa; Shigeo Tanuma; Kazuhiro Yoshihara


Journal of Alloys and Compounds | 2017

Superconductivity and its enhancement under high pressure in “F-free” single crystals of CeOBiS2

Masashi Tanaka; Masanori Nagao; Ryo Matsumoto; Noriyuki Kataoka; Ikuo Ueta; Hiromi Tanaka; Satoshi Watauchi; Isao Tanaka; Yoshihiko Takano


arXiv: Superconductivity | 2018

Pressure-induced Superconductivity in Sulfur-doped SnSe Single Crystal Using Boron-doped Diamond Electrode-prefabricated Diamond Anvil Cell

Ryo Matsumoto; Hiroshi Hara; Hiromi Tanaka; Kazuki Nakamura; Noriyuki Kataoka; Sayaka Yamamoto; Aichi Yamashita; Shintaro Adachi; Tetsuo Irifune; Hiroyuki Takeya; Yoshihiko Takano


The Japan Society of Applied Physics | 2018

Automatic Optimization for analyzing range of XPS spectra using active Shirley method

Ryo Murakami; Hironori Kageyama; Kazuki Nakamura; Noriyuki Kataoka; Hiromi Tanaka; Ryo Matsumoto; Hiroshi Shinozuka; Hideki Yoshikawa; Shigeo Tanuma; Kazuhiro Yoshihara


The Japan Society of Applied Physics | 2017

XPS depth analysis of Organofluorine compounds thin films by Using Ar-GCIB

Masashi Seki; Noriyuki Kataoka; Hiromi Tanaka


Procedia Engineering | 2017

AFM and XPS study from surfaces of native oxide/Al-metal

Yoshihiro Irie; Yujiro Maruo; Noriyuki Kataoka; Hiromi Tanaka; Kentaro Kinoshita; Satoru Kishida


Procedia Engineering | 2017

XPS study from a clean surface of Al2O3 single crystals

Tuguhiro Tago; Noriyuki Kataoka; Hiromi Tanaka; Kentaro Kinoshita; Satoru Kishida


Journal of Surface Analysis | 2017

Automatic Estimation of XPS spectrum Background Using an Active Shirley Method Improved by Auto-Tuning Function of Initial End Points

Yugo Nishizawa; Ryo Matsumoto; Noriyuki Kataoka; Hiromi Tanaka; Hideki Yoshikawa; Shigeo Tanuma; Kazuhiro Yoshihara


Journal of Surface Analysis | 2016

Automatic Background Estimation and Quantitative Analysis for XPS Spectrum by Active Shirley Method

Ryo Matsumoto; Yugo Nishizawa; Noriyuki Kataoka; Hiromi Tanaka; Hideki Yoshikawa; Shigeo Tanuma; Kazuhiro Yoshihara


Journal of Surface Analysis | 2015

XPS Analysis of BaTiO 3 Single Crystal Cleaned by Ar Gas Cluster Ion Beam

Masashi Seki; Hiromi Tanaka; Noriyuki Kataoka; Satoru Kishida

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Ryo Matsumoto

National Institute for Materials Science

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Hideki Yoshikawa

National Institute for Materials Science

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Shigeo Tanuma

National Institute for Materials Science

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Kazuhiro Yoshihara

National Institute for Materials Science

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Kentaro Kinoshita

Tokyo University of Science

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Yoshihiko Takano

National Institute for Materials Science

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Aichi Yamashita

National Institute for Materials Science

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