Ö.F. Yüksel

A detailed analysis of current-voltage characteristics of Au/perylene-monoimide/n-Si Schottky barrier diodes over a wide temperature range

The current-voltage characteristics of Au/perylene-monoimide (PMI)/n-Si Schottky device have been investigated at a wide temperature range between 75 and 300 K in detail. The measured current-voltage (I-V) characteristics of the device show a good rectification behavior at all temperatures. The electronic parameters such as the ideality factor and the barrier height are determined from the experimental data using standard current-voltage analysis method and also temperature dependence of these parameters is analyzed. In addition to the standard analysis, using the Cheung and Cheung method, the series resistance and some other electrical properties are calculated for the device, and a good agreement is obtained between relevant diode parameters. It was observed that Au/PMI/n-Si Schottky diodes exhibit space charge limited (SCL) conduction at all temperatures. Therefore, we have analyzed this SCL current mechanism in more detail. From this analysis, several electronic parameters related with the SCL mechani...

Analysis of I–V measurements on Ag/p-SnS and Ag/p-SnSe Schottky barriers

Abstract In this study, we have performed current–voltage (I–V) measurements on single crystals p-SnS and p-SnSe at different temperatures in the vicinity of room temperature. These compound semiconductors belong to IV–VI layered material class. Hence, they show strong anisotropy for all properties. We realized all measurements on the easy cleavage plane perpendicular c-axis. From I–V characteristics, we have tried to determine some intrinsic and contact properties such as barrier heights, diode ideality factors and carrier concentrations. It has been found that both contacts are in Schottky type, while Ag/p-SnSe structures has showed better diode behavior.

The modification of Schottky barrier height of Au/p-Si Schottky devices by perylene-diimide

Perylene-diimide (PDI) thin film was fabricated by spin coating method on p-Si single-crystal substrate to prepare Au/PDI/p-Si Schottky device. The electrical properties of the Au/PDI/p-Si Schottky device were investigated by current-voltage (I–V) measurements in the temperature range 80–300 K and room temperature capacitance-voltage (C–V) measurement. Results showed a rectification behavior. Junction parameters such as ideality factor (n), barrier height (ϕB0), series resistance (Rs) interface state density (Nss), built-in potential (Vbi), carrier concentration (NA), and the width of the depletion layer (WD) were obtained from the I–V and C–V measurements. The values of ideality factor (n) and barrier height (BH) for the Au/PDI/p-Si structure from the I–V measurements were obtained as 1.77 and 0.584 eV at 300 K, 7.78 and 0.176 eV at 80 K, respectively. It was seen that the BH value of 0.584 eV calculated for the Au/PDI/p-Si structure was significantly larger than the value of 0.34 eV of conventional Au/p...