Oh Reum | Researchain

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Archive | 2018

Gestapelte Speichervorrichtung und Speicherchip mit demselben

Yu Hak-Soo; Ryu Je-Min; Oh Reum; Kasibhatla Pavan Kumar; Hong Seok-In

Archive | 2018

Stacked memory device system including the same and associated method

Yu Hak Soo; Ryu Je Min; Oh Reum; Kasibhatla Pavan Kumar; Hong Seok In

Archive | 2018

STACKED MEMORY DEVICE AND A MEMORY CHIP INCLUDING THE SAME

Yu Hak-Soo; Ryu Je-Min; Oh Reum; Kasibhatla Pavan Kumar; Hong Seok-In

Archive | 2017

STACKED SEMICONDUCTOR DEVICE AND SYSTEM INCLUDING THE SAME

Lee Hae-Suk; Oh Reum; Park Jin-Seong; Woo Seung-Han

Archive | 2017

SEMICONDUCTOR APPARATUS, STACK SEMICONDUCTOR APPARATUS, AND TEST METHOD OF THE STACK SEMICONDUCTOR APPARATUS

Woo Seung-Han; Oh Reum; Lee Hae-Suk

Archive | 2017

Speichervorrichtung zum Durchführen eines internen Prozesses und Betriebsverfahren dafür

Oh Reum; Ryu Je-Min; Kasibhatla Pavan Kumar

Archive | 2017

SEMICONDUCTOR DEVICE USING A PARALLEL BIT OPERATION AND METHOD OF OPERATING THE SAME

Ryu Je-Min; Yu Hak-Soo; Oh Reum; Seo Seong-Young; Rho Soo-Jung

IEEE Journal of Solid-state Circuits | 2017

温度分布を考慮した高速ウエハレベルIO実験計画と適応リフレッシュを備えた1.2V,20nmの307GB/s HBM DRAM【Powered by NICT】

Sohn Kyomin; Yun Won-Joo; Oh Reum; Oh Chi-Sung; Seo Seong-Young; Park Min-Sang; Shin Dong-Hak; Jung Won-Chang; Shin Sang-Hoon; Ryu Je-Min; Yu Hye-Seung; Jung Jae-Hun; Lee Hyunui; Kang Seok-Yong; Sohn Young-Soo; Choi Jung-Hwan; Bae Yong-Cheol; Jang Seong-Jin; Jin Gyo-Young

Archive | 2012