Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where Óscar Iglesias-Freire is active.

Publication


Featured researches published by Óscar Iglesias-Freire.


Beilstein Journal of Nanotechnology | 2011

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

Miriam Jaafar; Óscar Iglesias-Freire; Luis Serrano-Ramón; M. R. Ibarra; José María de Teresa; A. Asenjo

Summary The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by physical techniques or ferromagnetic nanostructures. It is a usual procedure to separate the topography and the magnetic signal by scanning at a lift distance of 25–50 nm such that the long range tip–sample interactions dominate. Nowadays, MFM is becoming a valuable technique to detect weak magnetic fields arising from low dimensional complex systems such as organic nanomagnets, superparamagnetic nanoparticles, carbon-based materials, etc. In all these cases, the magnetic nanocomponents and the substrate supporting them present quite different electronic behavior, i.e., they exhibit large surface potential differences causing heterogeneous electrostatic interaction between the tip and the sample that could be interpreted as a magnetic interaction. To distinguish clearly the origin of the tip–sample forces we propose to use a combination of Kelvin probe force microscopy (KPFM) and MFM. The KPFM technique allows us to compensate in real time the electrostatic forces between the tip and the sample by minimizing the electrostatic contribution to the frequency shift signal. This is a great challenge in samples with low magnetic moment. In this work we studied an array of Co nanostructures that exhibit high electrostatic interaction with the MFM tip. Thanks to the use of the KPFM/MFM system we were able to separate the electric and magnetic interactions between the tip and the sample.


Journal of Applied Physics | 2012

Nanoscale magnetic structure and properties of solution-derived self-assembled La0.7Sr0.3MnO3 islands

Jone Zabaleta; Miriam Jaafar; Patricia Abellán; Carlos Montón; Óscar Iglesias-Freire; F. Sandiumenge; C.A. Ramos; Roberto Daniel Zysler; T. Puig; A. Asenjo; Narcis Mestres; X. Obradors

Strain-induced self-assembled La0.7Sr0.3MnO3 nanoislands of lateral size 50−150 nm and height 10−40 nm have been grown on yttria-stabilized zirconia (001)-substrates from ultradiluted chemical solutions based on metal propionates. The nanoislands grow highly relaxed withstanding the epitaxial relation (001)LSMO[110]//(001)YSZ[010] and show bulk-like average magnetic properties in terms of Curie temperature and saturation magnetization. The interplay of the magnetocrystalline and shape anisotropy within the nanoisland ensemble results in an in-plane magnetic anisotropy with a magnetocrystalline constant K1(150  K)=-(5±1)  kJ/m3 and in-plane easy axis along the [110]-La0.7Sr0.3MnO3 direction as measured, for the first time, through ferromagnetic resonance experiments. Magnetic force microscopy studies reveal the correlation between nanoisland size and its magnetic domain structure in agreement with micromagnetic simulations. In particular, we have established the required geometric conditions for single dom...


Nanoscale Research Letters | 2011

Hysteresis loops of individual Co nanostripes measured by magnetic force microscopy

Miriam Jaafar; Luis Serrano-Ramón; Óscar Iglesias-Freire; Amalio Fernández-Pacheco; M. R. Ibarra; José María de Teresa; A. Asenjo

High-resolution magnetic imaging is of utmost importance to understand magnetism at the nanoscale. In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field. The main result is the quantitative evaluation of the coercive field of the individual nanostructures. Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.


Journal of Applied Physics | 2014

Magnetic scanning gate microscopy of graphene Hall devices (invited)

R. K. Rajkumar; A. Asenjo; Vishal Panchal; Alessandra Manzin; Óscar Iglesias-Freire; Olga Kazakova

We have performed sensitivity mapping of graphene Hall devices with the width of 0.6–15 μm operating in the diffusive regime under non-uniform, local magnetic and electric fields induced by a scanning metallic magnetic probe. The transverse voltage was recorded, while tuning the magnitude and orientation of the bias current, the probe-sample distance, and orientation of the probe magnetization. A strong two-fold symmetry pattern has been observed, as a consequence of capacitive coupling between the probe and the sample. The effect is particularly pronounced in small devices (<1 μm), where the dominating electric field contribution significantly lowers the effective area of the magnetic sensor. We show that implementation of the Kelvin probe feedback loop in the standard scanning gate microscopy setup drastically reduces parasitic electric field effects and improves magnetic sensitivity.


IEEE Transactions on Magnetics | 2013

Magnetic Scanning Probe Calibration Using Graphene Hall Sensor

Vishal Panchal; Óscar Iglesias-Freire; Arseniy Lartsev; Rositza Yakimova; A. Asenjo; Olga Kazakova

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (Bprobe) for quantitative measurements. We present a straightforward calibration of Bprobe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined Bprobe ~ 70 mT and ~ 76 mT for probes with nominal magnetic moment ~ 1 × 10-13 and > 3 × 10-13 emu, respectively, at a probe-sample distance of 20 nm.


Applied Physics Letters | 2013

Tip-induced artifacts in magnetic force microscopy images

Óscar Iglesias-Freire; Jeffrey R. Bates; Yoichi Miyahara; A. Asenjo; Peter Grutter

Useful sample information can be extracted from the dissipation in frequency modulation atomic force microscopy due to its correlation to important material properties. It has been recently shown that artifacts can often be observed in the dissipation channel, due to the spurious mechanical resonances of the atomic force microscope instrument when the oscillation frequency of the force sensor changes. In this paper, we present another source of instrumental artifacts specific to magnetic force microscopy (MFM), which is attributed to a magnetization switching happening at the apex of MFM tips. These artifacts can cause a misinterpretation of the domain structure in MFM images of magnetic samples.


Nanotechnology | 2015

Spin configuration in isolated FeCoCu nanowires modulated in diameter.

Óscar Iglesias-Freire; Cristina Bran; Eider Berganza; Ignacio Mínguez-Bacho; C. Magen; Manuel Vazquez; A. Asenjo

Cylindrical Fe28Co67Cu5 nanowires modulated in diameter between 22 and 35 nm are synthesized by electroplating into the nanopores of alumina membranes. High-sensitivity MFM imaging (with a detection noise of 1 μN m(-1)) reveals the presence of single-domain structures in remanence with strong contrast at the ends of the nanowires, as well as at the transition regions where the diameter is modulated. Micromagnetic simulations suggest that curling of the magnetization takes place at these transition sites, extending over 10-20 nm and giving rise to stray fields measurable with our MFM. An additional weaker contrast is imaged, which is interpreted to arise from inhomogeneities in the nanowire diameter.


Beilstein Journal of Nanotechnology | 2016

Customized MFM probes with high lateral resolution

Óscar Iglesias-Freire; Miriam Jaafar; Eider Berganza; A. Asenjo

Summary Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and poor lateral resolution when working under standard conditions. In this work, we present a convenient route to prepare high-performance MFM probes with sub-10 nm (sub-25 nm) topographic (magnetic) lateral resolution by following an easy and quick low-cost approach. This allows one to not only customize the tip stray field, avoiding tip-induced changes in the sample magnetization, but also to optimize MFM imaging in vacuum (or liquid media) by choosing tips mounted on hard (or soft) cantilevers, a technology that is currently not available on the market.


ACS Applied Materials & Interfaces | 2014

Thin Film Multiferroic Nanocomposites by Ion Implantation

Miguel Algueró; J. Ricote; Maria J. Torres; Harvey Amorín; Aurora Alberca; Óscar Iglesias-Freire; Norbert M. Nemes; S. Holgado; M. Cervera; J. Piqueras; A. Asenjo; M. García-Hernández

Thin film multiferroic nanocomposites might enable a range of potentially disruptive integrated magnetoelectric devices for information storage, spintronics, microwave telecommunications, and magnetic sensing. With this aim, we have investigated ion implantation of magnetic species into ferroelectric single crystal targets as a radically novel approach to prepare film nanoparticulate magnetic-metal ferroelectric-oxide composites. These materials are an alternative to multiferroic oxide epitaxial columnar nanostructures that are under intensive research, but whose magnetoelectric response is far from expectations. Here, we unambiguously demonstrate the preparation of such a thin film multiferroic nanocomposite of Co and BaTiO3 by ion implantation of a high dose of the magnetic species, followed by rapid thermal processing under tailored conditions. Results thus constitute a proof of concept for the feasibility of obtaining the materials by this alternative approach. Ion implantation is a standard technique for the microelectronic industry in combination with well-established patterning procedures.


Nanotechnology | 2013

Effect of using stencil masks made by focused ion beam milling on permalloy (Ni81Fe19) nanostructures.

Jeffrey R. Bates; Yoichi Miyahara; J A J Burgess; Óscar Iglesias-Freire; Peter Grutter

Focused ion beam (FIB) milling is a common fabrication technique to make nanostencil masks which has the unintended consequence of gallium ion implantation surrounding milled features in silicon nitride membranes. We observe major changes in film structure, chemical composition, and magnetic behaviour of permalloy nanostructures deposited by electron beam evaporation using silicon nitride stencil masks made by a FIB as compared to stencil masks made by regular lithography techniques. We characterize the stenciled structures and both types of masks using transmission electron microscopy, electron energy loss spectroscopy, energy dispersive x-ray spectroscopy, magnetic force microscopy and kelvin probe force microscopy. All these techniques demonstrate distinct differences at a length scale of a 1-100 nm for the structures made using stencil mask fabricated using a FIB. The origin of these differences seems to be related to the presence of implanted ions, a detailed understanding of the mechanism however remains to be developed.

Collaboration


Dive into the Óscar Iglesias-Freire's collaboration.

Top Co-Authors

Avatar

A. Asenjo

Spanish National Research Council

View shared research outputs
Top Co-Authors

Avatar

Miriam Jaafar

Spanish National Research Council

View shared research outputs
Top Co-Authors

Avatar
Top Co-Authors

Avatar

Carlos Moya

University of Barcelona

View shared research outputs
Top Co-Authors

Avatar

Eider Berganza

Spanish National Research Council

View shared research outputs
Top Co-Authors

Avatar
Top Co-Authors

Avatar
Top Co-Authors

Avatar
Top Co-Authors

Avatar
Top Co-Authors

Avatar
Researchain Logo
Decentralizing Knowledge