Pascal Royer

Enlarged sample holder for optical AFM imaging: Millimeter scanning with high resolution

We developed a home-made Sample-Holder Unit used for 2D nano-positionning with millimeter traveling ranges. For each displacement axis, the system includes a long range traveling stage and a piezoelectric actuator for accurate positioning. Specific electronics is integrated according to metrological considerations, enhancing the repeatability performances. The aim of this work is to demonstrate that near-field microscopy at the scale of a chip is possible. We chose here to characterize highly integrated optical structures. For this purpose, the sample-holder is integrated into an Atomic Force Microscope in order to perform optical imaging. To demonstrate the overall performances, a millimeter scale optical images have been realized.

CoBiSS: Compact Bidimensional Sampling Spectrometer

Novel technology for static Fourier spectrometer based on 2D angle-tilted array of nanostructured glass surface on which light beams interfere in total internal reflection. Near field subwavelength spatial sampling is achieved by tilt angle control.

Enlarged Sample Holder for Optical AFM Imaging: Millimeter Scanning with High Resolution

We developed a home-made Sample-Holder Unit used for 2D nano-positionning with millimeter traveling ranges. For each displacement axis, the system includes a long range traveling stage and a piezoelectric actuator for accurate positioning. Specific electronics is integrated according to metrological considerations, enhancing the repeatability performances. The aim of this work is to demonstrate that near-field microscopy at the scale of a chip is possible. We chose here to characterize highly integrated optical structures. For this purpose, the sample-holder is integrated into an Atomic Force Microscope in order to perform optical imaging. To demonstrate the overall performances, a millimeter scale optical images have been realized.

Large area sample holder unit for enhanced near field microscopy applications

Near-field microscopy applications sometimes require scanning the sample over the millimetre range. This paper describes a home-made displacement system that can replace the limited range XY scanner of a classical near-field microscope. The system lays on a coarse/fine displacements configuration to attain the millimetre. Nanometre scale repeatability and resolution are met thanks to a control loop based on phase shifting techniques. The system was tested under an Atomic Force Microscope. The setup of the experiments and the results obtained are herein presented.

Mapping of localized surface plasmon fields via exposure of a photosensitive polymer

We present a method for mapping the electromagnetic field distribution in the vicinity of noble metal nanoparticles able to sustain localised surface plasmon resonance (LSPR). The field distribution is coded by topographic change in a self-developing photosensitive polymer (PMMA-DR1). Metallic nanostructures are fabricated by e-beam lithography and optically characterised by extinction spectroscopy. Photoinduced topographic changes are checked by means of atomic force microscopy (AFM). The dipolar character of the surface modification around the particles agrees qualitatively with theoretical predictions and a strong correlation between LSPR position and the relief depth is found.