Paul Chekhonin

Strain induced superconductivity in the parent compound BaFe2As2

The discovery of superconductivity with a transition temperature, Tc, up to 65 K in single-layer FeSe (bulk Tc=8 K) films grown on SrTiO3 substrates has attracted special attention to Fe-based thin films. The high Tc is a consequence of the combined effect of electron transfer from the oxygen-vacant substrate to the FeSe thin film and lattice tensile strain. Here we demonstrate the realization of superconductivity in the parent compound BaFe2As2 (no bulk Tc) just by tensile lattice strain without charge doping. We investigate the interplay between strain and superconductivity in epitaxial BaFe2As2 thin films on Fe-buffered MgAl2O4 single crystalline substrates. The strong interfacial bonding between Fe and the FeAs sublattice increases the Fe-Fe distance due to the lattice misfit, which leads to a suppression of the antiferromagnetic spin density wave and induces superconductivity with bulk Tc≈10 K. These results highlight the role of structural changes in controlling the phase diagram of Fe-based superconductors.

Hall-plot of the phase diagram for Ba(Fe 1− x Co x ) 2 As 2

The Hall effect is a powerful tool for investigating carrier type and density. For single-band materials, the Hall coefficient is traditionally expressed simply by , where e is the charge of the carrier, and n is the concentration. However, it is well known that in the critical region near a quantum phase transition, as it was demonstrated for cuprates and heavy fermions, the Hall coefficient exhibits strong temperature and doping dependencies, which can not be described by such a simple expression, and the interpretation of the Hall coefficient for Fe-based superconductors is also problematic. Here, we investigate thin films of Ba(Fe1−xCox)2As2 with compressive and tensile in-plane strain in a wide range of Co doping. Such in-plane strain changes the band structure of the compounds, resulting in various shifts of the whole phase diagram as a function of Co doping. We show that the resultant phase diagrams for different strain states can be mapped onto a single phase diagram with the Hall number. This universal plot is attributed to the critical fluctuations in multiband systems near the antiferromagnetic transition, which may suggest a direct link between magnetic and superconducting properties in the BaFe2As2 system.

Investigations on residual strains and the cathodoluminescence and electron beam induced current signal of grain boundaries in silicon

Cathodoluminescence (CL) and electron beam induced current (EBIC) measurements were used to investigate the optical behavior and electrical activity of grain boundaries (GBs) in coarsely grained silicon. Electron backscatter diffraction (EBSD) was applied for a comprehensive characterization of the structural properties of the high angle and low angle GBs (HAGBs and LAGBs) in the sample. It was found that not only the EBIC but also the panchromatic (pan) CL contrast of Σ3 HAGBs strongly depends on the hkl-type of the boundary plane. At room temperature coherent Σ3 GBs exhibit no significant contrast in the CL or EBIC images, whereas at low temperatures the pan-CL contrast is strong. For incoherent Σ3 GBs, a strong pan-CL and EBIC contrast was observed in the entire temperature range. Only on a LAGB (misorientation angle 4.5°) CL investigations at low temperatures revealed a line with peak position at about (0.82 ± 0.01) eV, usually related to the dislocation associated D1 transition. Cross-correlation EBS...

Local Orientation Variations in YBCO Films on Technical Substrates - A Combined SEM and EBSD Study

Scanning electron microscope imaging and electron backscatter diffraction are applied to 400 nm thick YBCO films grown on Ni-9at.%W and ABAD-YSZ tape. On Ni-9at.%W tape, the orientation of YBCO strongly varies from grain to grain, which is attributed to the different orientations of the underlying substrate grains with regard to the surface normal. On ABAD-YSZ, the structures causing the orientation variations are observed on a micrometer scale only, which is attributed to the granularity of the template. In contrast to Ni-9at.%W where no preferred misorientation axis is notable within single substrate grains, the misorientation of YBCO on the ABAD-YSZ tape is primarily caused by lattice rotations about the sample normal.

Influence of the polarization anisotropy on the electrocaloric effect in epitaxial PMN-PT thin films

Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT) compounds, which are typically used for high performance actuator applications due to their outstanding piezoelectric properties, show, in addition, a pronounced electrocaloric (EC) effect. The study of epitaxial films is a useful tool to analyze the correlation between the microstructure and EC properties in order to optimize the performance of these materials. Therefore, the 0.9PMN-0.1PT films were grown by a pulsed laser deposition on (001) as well as (111) oriented SrTiO3 single crystalline substrates using a La0.7Sr0.3CoO3 buffer as the bottom electrode and additional Au top electrodes. The structural properties determined by a high resolution X-ray and electron microscopy techniques indicated an undisturbed epitaxial growth. The anisotropy of the ferroelectric domain structure was investigated by a vertical and lateral piezoresponse force microscopy showing clear differences between the two orientations. A significant reduction of the thermal hysteresis was observed ...

Effect of back pressure on material flow and texture in ECAP of aluminum

Large billets (5 x 5 x 30) cm3 of technically pure aluminum (AA 1050) taken from thick rolled sheets were deformed at room temperature by single pass equal-channel angular pressing (ECAP). ECAP was done at different back pressures (0 – 60 MPa) using a square die with channels intersecting at 90° in sharp corners. The normal direction of rolling was taken parallel to the transverse direction of ECAP. The flow pattern was visualized by marker lines on split billets. The initial texture of the coarse-grained rolled sheet was measured by neutron diffraction. After ECAP, X-ray diffraction was used to measure the texture gradient from top to bottom of the billets. The results show, that with increasing back pressure the corner gap is closed and the flow line pattern becomes more symmetric. The flow line exponent increases strongly from top to bottom of the billets. Moreover, the inhomogeneous deformed zone at the bottom of the billets becomes smaller. The texture changes from a typical rolling texture to a typical shear texture with the intensity of the different shear texture components changing with back pressure. For the ACcomponent splitting is observed. The texture changes are discussed considering Toths flow line model and grain refinement.

The influence of the in-plane lattice constant on the superconducting transition temperature of FeSe0.7Te0.3 thin films

Epitaxial Fe(Se,Te) thin films were prepared by pulsed laser deposition on (La0.18Sr0.82)(Al0.59Ta0.41)O3 (LSAT), CaF2-buffered LSAT and bare CaF2 substrates, which exhibit an almost identical in-plane lattice parameter. The composition of all Fe(Se,Te) films were determined to be FeSe0.7Te0.3 by energy dispersive X-ray spectroscopy, irrespective of the substrate. Albeit the lattice parameters of all templates have comparable values, the in-plane lattice parameter of the FeSe0.7Te0.3 films varies significantly. We found that the superconducting transition temperature (Tc) of FeSe0.7Te0.3 thin films is strongly correlated with their a-axis lattice parameter. The highest Tc of over 19 K was observed for the film on bare CaF2 substrate, which is related to unexpectedly large in-plane compressive strain originating mostly from the thermal expansion mismatch between the FeSe0.7Te0.3 film and the substrate.Epitaxial Fe(Se,Te) thin films were prepared by pulsed laser deposition on (La0.18Sr0.82)(Al0.59Ta0.41)O3 (LSAT), CaF2-buffered LSAT and bare CaF2 substrates, which exhibit an almost identical in-plane lattice parameter. The composition of all Fe(Se,Te) films were determined to be FeSe0.7Te0.3 by energy dispersive X-ray spectroscopy, irrespective of the substrate. Albeit the lattice parameters of all templates have comparable values, the in-plane lattice parameter of the FeSe0.7Te0.3 films varies significantly. We found that the superconducting transition temperature (Tc) of FeSe0.7Te0.3 thin films is strongly correlated with their a-axis lattice parameter. The highest Tc of over 19 K was observed for the film on bare CaF2 substrate, which is related to unexpectedly large in-plane compressive strain originating mostly from the thermal expansion mismatch between the FeSe0.7Te0.3 film and the substrate.

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Extended defects such as dislocations and grain boundaries have a strong influence on the performance of microelectronic devices and on other applications of semiconductor materials. However, it is still under debate how the defect structure determines the band structure, and therefore, the recombination behavior of electron-hole pairs responsible for the optical and electrical properties of the extended defects. The present paper is a survey of procedures for the spatially resolved investigation of structural and of physical properties of extended defects in semiconductor materials with a scanning electron microscope (SEM). Representative examples are given for crystalline silicon. The luminescence behavior of extended defects can be investigated by cathodoluminescence (CL) measurements. They are particularly valuable because spectrally and spatially resolved information can be obtained simultaneously. For silicon, with an indirect electronic band structure, CL measurements should be carried out at low temperatures down to 5 K due to the low fraction of radiative recombination processes in comparison to non-radiative transitions at room temperature. For the study of the electrical properties of extended defects, the electron beam induced current (EBIC) technique can be applied. The EBIC image reflects the local distribution of defects due to the increased charge-carrier recombination in their vicinity. The procedure for EBIC investigations is described for measurements at room temperature and at low temperatures. Internal strain fields arising from extended defects can be determined quantitatively by cross-correlation electron backscatter diffraction (ccEBSD). This method is challenging because of the necessary preparation of the sample surface and because of the quality of the diffraction patterns which are recorded during the mapping of the sample. The spatial resolution of the three experimental techniques is compared.

Mechanical Anisotropy of Aluminium Laminates Produced by ARB

The plastic anisotropy was studied on aluminium sheets with layers of different purity (A: 5N and B: 2N+) produced by accumulative roll bonding (ARB). Both material layers show a contrasting recrystallization behavior where A and B are discontinuously and continuously recrystallized, respectively. Global textures were measured by neutron diffraction. The mechanical anisotropy was measured by tensile testing after different numbers of ARB cycles. The planar anisotropy decreases with the number of ARB cycles while the normal anisotropy reaches a plateau after 4 cycles. Simulations of the Lankford parameters were carried out with the help of the viscoplastic self-consistent scheme (based on the global texture) and compared with the experimental data. Deviations of the simulated values from those of experiment are discussed with regard to through-thickness texture and material heterogeneities.