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Dive into the research topics where Paul T. Vianco is active.

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Featured researches published by Paul T. Vianco.


Journal of Electronic Packaging | 2006

A Practical Viscoplastic Damage Model for Lead-Free Solder

Arlo F. Fossum; Paul T. Vianco; Mike Neilsen; David M. Pierce

This paper summarizes the results of a program to construct an internal variable viscoplastic damage model to characterize 95.5Sn-3.9Ag-0.6Cu (wt.%) lead-free solder under cyclic thermomechanical loading conditions. A unified model is enhanced to account for a deteriorating microstructure through the use of an isotropic damage evolution equation. Model predictions versus experimental data are given for constant strain-rate tests that were conducted at strain rates of 4.2 X 10 -5 s -1 and 8.3 X 10 -4 s -1 over a temperature range from -25°C to 160°C; cyclic shear tests; and elevated-temperature creep tests. A description is given of how this work supports larger ongoing efforts to develop a predictive capability in materials aging and reliability, and solder interconnect reliability.


Journal of Electronic Packaging | 2008

Validation of a General Fatigue Life Prediction Methodology for Sn-Ag-Cu Lead-Free Solder Alloy Interconnects

David M. Pierce; Sheri Sheppard; Paul T. Vianco; Jerome A. Regent; J. Mark Grazier

A general fatigue life prediction methodology, based on a unified creep plasticity damage (UCPD) model, was developed for predicting fatigue cracks in 95.5Sn-3.9Ag-0.6Cu (wt %) solder interconnects. The methodology was developed from isothermal fatigue tests using a double-lap-shear specimen. Finite element analysis model geometries, mesh densities, and assumptions were detailed for both a full model (an octant-symmetry slice of the entire ball grid array (BGA) assembly) and a submodel (the solder joint deemed most likely to fail and the surrounding package layers) to facilitate fatigue prediction. Model validation was based on the thermal mechanical fatigue of plastic BGA solder joints (250-4000 thermal cycles, -55°C to 125°C, and 10°C/min). Metallographic cross sections were used to quantitatively measure crack development. The methodology generally underpredicted the crack lengths but, nonetheless, captured the measured crack lengths within a ±2X error band. Possible shortcomings in the methodology, including inaccurate materials properties and part geometries, as well as computational techniques, are discussed in terms of improving both the UCPD constitutive model and the fatigue life prediction methodology fidelity and decreasing the solution time.


Archive | 2015

THERMAL MECHANICAL FATIGUE OF A 56 I/O PLASTIC QUAD-FLAT NOLEAD (PQFN) PACKAGE.

Paul T. Vianco; Michael K. Neilsen


Archive | 2010

Temperature cycling of Pb-free and mixed solder interconnections used on a package-on-package test vehicle.

Carmine Meola; Fred Verdi; John Mark Grazier; Alice C. Kilgo; Paul T. Vianco; Jerome A. Rejent


Archive | 2013

Run-out Phenomenon in Ag-Cu-Zr Active Braze Joints Made Between Alumina and an Fe-Ni-Co Alloy.

Paul T. Vianco; Charles A. Walker; Bonnie Beth McKenzie; Alice C. Kilgo; Thomas Ben Crenshaw; Dennis J. De Smet


Archive | 2012

Long Term Reliability of Eutectic SN-Pb and Pb-free Solder Joints Made to the ENEPIG Surface Finish.

William Johannes; Paul T. Vianco; Jerome A. Rejent; Bonnie Beth McKenzie


5th International Brazing and Soldering Conference | 2011

Recent Tin Whisker Research at Sandia.

Donald Francis Susan; Paul T. Vianco; William Graham Yelton; Joseph R. Michael


International Symposium on Microelectronics | 2014

Laser Ablation of Thin Films on LTCC.

M. A. Girardi; Kenneth A. Peterson; Paul T. Vianco; R. Grondin; D. Wieliczka


Archive | 2017

predicting the reliability of package-on-package-on-package (popop) interconnections based on accelerated aging experiments and computational modeling.

Paul T. Vianco; Jerome A. Rejent; Alice C. Kilgo; Bonnie Beth McKenzie; Michael K. Neilsen


Archive | 2015

ESTABLISHING A TI-CU-PT-AU THIN FILM ? ON ? LOW TEMPERATURE CO-FIRED CERAMIC (LTCC) TECHNOLOGY FOR HIGH TEMPERATURE ELECTRONICS.

Paul T. Vianco; Michael K. Neilsen; Bonnie Beth McKenzie; John Mark Grazier; Jerome A. Rejent; Amy Allen; Esteban Guerrero; William Price

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Alice C. Kilgo

Sandia National Laboratories

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Jerome A. Rejent

Sandia National Laboratories

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Bonnie Beth McKenzie

Sandia National Laboratories

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Michael K. Neilsen

Sandia National Laboratories

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Donald Francis Susan

Sandia National Laboratories

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Amy Allen

Sandia National Laboratories

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Gary L. Zender

Sandia National Laboratories

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Joseph R. Michael

Sandia National Laboratories

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Richard P. Grant

Sandia National Laboratories

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