Per-Anders Thorén

A virtual instrument to standardise the calibration of atomic force microscope cantilevers

Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This calibration is performed without reference to a global standard, hindering the robust comparison of force measurements reported by different laboratories. Here, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others-standardising AFM force measurements-and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibration.

Intermodulation electrostatic force microscopy for imaging surface photo-voltage

We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear capacitance gives intermodulation products of the two drive frequencies near the cantilever resonance, where they are measured with high signal to noise ratio. Analysis of this intermodulation response allows for quantitative reconstruction of the contact potential difference. We derive the theory of the method, validate it with numerical simulation and a control experiment, and we demonstrate its utility for fast imaging of the surface photo-voltage on an organic photo-voltaic material.

Imaging high-speed friction at the nanometer scale

Friction is a complicated phenomenon involving nonlinear dynamics at different length and time scales. Understanding its microscopic origin requires methods for measuring force on nanometer-scale asperities sliding at velocities reaching centimetres per second. Despite enormous advances in experimental technique, this combination of small length scale and high velocity remain elusive. We present a technique for rapidly measuring the frictional forces on a single asperity over a velocity range from zero to several centimetres per second. At each image pixel we obtain the velocity dependence of both conservative and dissipative forces, revealing the transition from stick-slip to smooth sliding friction. We explain measurements on graphite using a modified Prandtl–Tomlinson model, including the damped elastic deformation of the asperity. With its improved force sensitivity and small sliding amplitude, our method enables rapid and detailed surface mapping of the velocity dependence of frictional forces with less than 10 nm spatial resolution.

Background-Force Compensation in Dynamic Atomic Force Microscopy

Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of interest for det ...

Calibrating torsional eigenmodes of micro-cantilevers for dynamic measurement of frictional forces

Non-invasive thermal noise calibration of both torsional and flexural eigenmodes is performed on numerous cantilevers of 10 different types. We show that for all tipless and short-tipped cantilevers, the ratio of torsional to flexural mode stiffness is given by the ratio of their resonant frequency times a constant, unique to that cantilever type. By determining this constant, we enable a calibration of the torsional eigenmode, starting from a calibration of the flexural eigenmode. Our results are well motivated from beam theory, and we verify them with finite element simulation.