Peter Milde
Dresden University of Technology
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Publication
Featured researches published by Peter Milde.
Nature Materials | 2015
I. Kezsmarki; Sándor Bordács; Peter Milde; Erik Neuber; Lukas M. Eng; J. S. White; Henrik M. Rønnow; C. D. Dewhurst; Masahito Mochizuki; K. Yanai; Hiroyuki Nakamura; D. Ehlers; V. Tsurkan; A. Loidl
Following the early prediction of the skyrmion lattice (SkL)--a periodic array of spin vortices--it has been observed recently in various magnetic crystals mostly with chiral structure. Although non-chiral but polar crystals with Cnv symmetry were identified as ideal SkL hosts in pioneering theoretical studies, this archetype of SkL has remained experimentally unexplored. Here, we report the discovery of a SkL in the polar magnetic semiconductor GaV4S8 with rhombohedral (C3v) symmetry and easy axis anisotropy. The SkL exists over an unusually broad temperature range compared with other bulk crystals and the orientation of the vortices is not controlled by the external magnetic field, but instead confined to the magnetic easy axis. Supporting theory attributes these unique features to a new Néel-type of SkL describable as a superposition of spin cycloids in contrast to the Bloch-type SkL in chiral magnets described in terms of spin helices.
Nano Letters | 2009
Alexander Haussmann; Peter Milde; Christiane Erler; Lukas M. Eng
We report on both the assembly of noble-metal nanowires by means of the nanotechnological and large-scale integrable approach of ferroelectric lithography and their performance testing upon electrical transport. Our results on LiNbO(3) single crystal templates show that the deposition of different elemental metals from ionic solutions by photochemical reduction is confined to the ferroelectric 180 degrees domain walls. Current-voltage-characteristics recorded from such nanowires of typically 30-300 microm in length revealed an Ohmic behavior that even improved with time. Additionally, we also examined the local topographic and potentiostatic properties of such wires using dynamic scanning force microscopy in combination with Kelvin probe force microscopy.
Advanced Materials | 2014
Jan Seidel; Morgan Trassin; Yi Zhang; Peter Maksymovych; Tino Uhlig; Peter Milde; Denny Köhler; Arthur P. Baddorf; Sergei V. Kalinin; Lukas M. Eng; Xiaoqing Pan; R. Ramesh
Anisotropic electronic conductivity is reported for isosymmetric phase boundaries in highly strained bismuth ferrite, which are the (fully epitaxial) connecting regions between two different structural variants of the same material. Strong correlations between nanoscale phase transition and local electronic conductivity are found. A high degree of control over their electronic properties can be attained through non-local electrical switching.
Applied Physics Letters | 2009
Hendrik Hölscher; Peter Milde; Ulrich Zerweck; Lukas M. Eng; R. Hoffmann
The oscillation of a cantilever in ultrahigh vacuum dynamic force microscopy is sometimes measured with the help of a Fabry–Perot interferometer. We show that the photoinduced forces present in such an interferometer can artificially increase or decrease the effective quality factor of the cantilever. We examine this effect on the basis of a PtIr-coated rectangular silicon cantilever at temperatures between 7.7 and 30 K. By measuring resonance curves we demonstrate that the magnitude of the effective quality factor changes with cantilever-fiber distance, laser power, and temperature.
Nano Letters | 2016
S. L. Zhang; A. Bauer; D. M. Burn; Peter Milde; Erik Neuber; Lukas M. Eng; H. Berger; Christian Pfleiderer; G. van der Laan; T. Hesjedal
Magnetic skyrmions in chiral magnets are nanoscale, topologically protected magnetization swirls that are promising candidates for spintronics memory carriers. Therefore, observing and manipulating the skyrmion state on the surface level of the materials are of great importance for future applications. Here, we report a controlled way of creating a multidomain skyrmion state near the surface of a Cu2OSeO3 single crystal, observed by soft resonant elastic X-ray scattering. This technique is an ideal tool to probe the magnetic order at the L3 edge of 3d metal compounds giving an average depth sensitivity of ∼50 nm. The single-domain 6-fold-symmetric skyrmion lattice can be broken up into domains, overcoming the propagation directions imposed by the cubic anisotropy by applying the magnetic field in directions deviating from the major cubic axes. Our findings open the door to a new way to manipulate and engineer the skyrmion state locally on the surface or on the level of individual skyrmions, which will enable applications in the future.
Journal of Applied Physics | 2015
J. Murawski; T. Graupner; Peter Milde; R. Raupach; U. Zerweck-Trogisch; Lukas M. Eng
Knowledge on surface potential dynamics is crucial for understanding the performance of modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin-probe force microscopy that enables a quantitative measurement of dynamic surface potentials at nanosecond-time and nanometer-length scales. Also, we investigate the performance of pump-probe Kelvin-probe force microscopy with respect to the relevant experimental parameters. We exemplify a measurement on an organic field effect transistor that verifies the undisturbed functionality of our pump-probe approach in terms of simultaneous and quantitative mapping of topographic and electronic information at a high lateral and temporal resolution.
Journal of Applied Physics | 2015
J. Murawski; T. Mönch; Peter Milde; M. P. Hein; S. Nicht; U. Zerweck-Trogisch; Lukas M. Eng
One of the great challenges in designing modern organic field-effect transistors is lowering the injection barriers that arise at the interfaces between the metallic electrodes and the semiconducting transport channel. Currently, these barriers are quantified mostly by time-independent and external inspection, techniques lacking temporal insight into the most relevant switching dynamics. We address this problem here by pump-probe Kelvin-probe force microscopy, which combines the high spatial resolution of standard Kelvin-probe force microscopy with a pump-probe, enabling time resolution down to nanoseconds. When investigating a dynamically operated pentacene-based organic field-effect transistor, pump-probe Kelvin-probe force microscopy is capable of in-situ probing the temporal charge evolution at any sample spot within the device. Thus, Schottky-barriers arising at the boundaries between electrodes and transport channel are identified as speed bumps for high-speed organic field-effect transistor operation, manifested by residual charges that are retained within the organic film upon switching the device.
ACS Nano | 2014
Julia L. Neff; Peter Milde; Carmen Pérez León; Matthew D. Kundrat; Lukas M. Eng; Christoph R. Jacob; Regina Hoffmann-Vogel
In the field of molecular electronics, thin films of molecules adsorbed on insulating surfaces are used as the functional building blocks of electronic devices. Control of the structural and electronic properties of the thin films is required for reliably operating devices. Here, noncontact atomic force and Kelvin probe force microscopies have been used to investigate the growth and electrostatic landscape of pentacene on KBr(001) and KCl(001) surfaces. We have found that, together with molecular islands of upright standing pentacene, a new phase of tilted molecules appears near step edges on KBr. Local contact potential differences (LCPD) have been studied with both Kelvin experiments and density functional theory calculations. Our images reveal that differently oriented molecules display different LCPD and that their value is independent of the number of molecular layers. These results point to the formation of an interface dipole, which may be explained by a partial charge transfer from the pentacene to the surface. Moreover, the monitoring of the evolution of the pentacene islands shows that they are strongly affected by dewetting: Multilayers build up at the expense of monolayers, and in the Kelvin images, previously unknown line defects appear, which reveal the epitaxial growth of pentacene crystals.
Scientific Reports | 2017
Ádám Butykai; Sándor Bordács; István Kézsmárki; V. Tsurkan; A. Loidl; Jonathan Döring; Erik Neuber; Peter Milde; Susanne C. Kehr; Lukas M. Eng
GaV4S8 is a multiferroic semiconductor hosting Néel-type magnetic skyrmions dressed with electric polarization. At Ts = 42 K, the compound undergoes a structural phase transition of weakly first-order, from a non-centrosymmetric cubic phase at high temperatures to a polar rhombohedral structure at low temperatures. Below Ts, ferroelectric domains are formed with the electric polarization pointing along any of the four 〈111〉 axes. Although in this material the size and the shape of the ferroelectric-ferroelastic domains may act as important limiting factors in the formation of the Néel-type skyrmion lattice emerging below TC = 13 K, the characteristics of polar domains in GaV4S8 have not been studied yet. Here, we report on the inspection of the local-scale ferroelectric domain distribution in rhombohedral GaV4S8 using low-temperature piezoresponse force microscopy. We observed mechanically and electrically compatible lamellar domain patterns, where the lamellae are aligned parallel to the (100)-type planes with a typical spacing between 100 nm–1.2 μm. Since the magnetic pattern, imaged by atomic force microscopy using a magnetically coated tip, abruptly changes at the domain boundaries, we expect that the control of ferroelectric domain size in polar skyrmion hosts can be exploited for the spatial confinement and manipulation of Néel-type skyrmions.
Journal of Applied Physics | 2009
Maxim P. Nikiforov; Susanne C. Kehr; Tae-Hong Park; Peter Milde; Ulrich Zerweck; Christian Loppacher; Lukas M. Eng; Michael J. Therien; Nader Engheta; Dawn A. Bonnell
The idealized system of an atomically flat metallic surface [highly oriented pyrolytic graphite (HOPG)] and an organic monolayer (porphyrin) was used to determine whether the dielectric function and associated properties of thin films can be accessed with scanning–near-field scanning optical microscopy (s-NSOM). Here, we demonstrate the use of harmonics up to fourth order and the polarization dependence of incident light to probe dielectric properties on idealized samples of monolayers of organic molecules on atomically smooth substrates. An analytical treatment of light/sample interaction using the s-NSOM tip was developed in order to quantify the dielectric properties. The theoretical analysis and numerical modeling, as well as experimental data, demonstrate that higher order harmonic scattering can be used to extract the dielectric properties of materials with tens of nanometer spatial resolution. To date, the third harmonic provides the best lateral resolution(∼50 nm) and dielectric constant contrast ...