Peter W. van Rijn
Princeton University
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Featured researches published by Peter W. van Rijn.
Assessment | 2013
Wim Van der Elst; Carolijn Ouwehand; Peter W. van Rijn; Nikki C. Lee; Martin P. J. van Boxtel; Jelle Jolles
The purpose of the present study was to evaluate the psychometric properties of a shortened version of the Raven Standard Progressive Matrices (SPM) under an item response theory framework (the one- and two-parameter logistic models). The shortened Raven SPM was administered to N = 453 cognitively healthy adults aged between 24 and 83 years. The IQ point estimates that were obtained under the one- and two-parameter logistic models were very similar (r = .97), but the two-parameter logistic-based test version had a higher measurement precision. The results showed that older age and being female were associated with a lower Raven SPM test performance. A user-friendly computer program was provided to facilitate the scoring and norming of the shortened Raven SPM under the different frameworks.
British Journal of Mathematical and Statistical Psychology | 2017
Peter W. van Rijn; Usama S. Ali
We compare three modelling frameworks for accuracy and speed of item responses in the context of adaptive testing. The first framework is based on modelling scores that result from a scoring rule that incorporates both accuracy and speed. The second framework is the hierarchical modelling approach developed by van der Linden (2007, Psychometrika, 72, 287) in which a regular item response model is specified for accuracy and a log-normal model for speed. The third framework is the diffusion framework in which the response is assumed to be the result of a Wiener process. Although the three frameworks differ in the relation between accuracy and speed, one commonality is that the marginal model for accuracy can be simplified to the two-parameter logistic model. We discuss both conditional and marginal estimation of model parameters. Models from all three frameworks were fitted to data from a mathematics and spelling test. Furthermore, we applied a linear and adaptive testing mode to the data off-line in order to determine differences between modelling frameworks. It was found that a model from the scoring rule framework outperformed a hierarchical model in terms of model-based reliability, but the results were mixed with respect to correlations with external measures.
Psychometrika | 2018
Peter W. van Rijn; Usama S. Ali
We propose a generalization of the speed–accuracy response model (SARM) introduced by Maris and van der Maas (Psychometrika 77:615–633, 2012). In these models, the scores that result from a scoring rule that incorporates both the speed and accuracy of item responses are modeled. Our generalization is similar to that of the one-parameter logistic (or Rasch) model to the two-parameter logistic (or Birnbaum) model in item response theory. An expectation–maximization (EM) algorithm for estimating model parameters and standard errors was developed. Furthermore, methods to assess model fit are provided in the form of generalized residuals for item score functions and saddlepoint approximations to the density of the sum score. The presented methods were evaluated in a small simulation study, the results of which indicated good parameter recovery and reasonable type I error rates for the residuals. Finally, the methods were applied to two real data sets. It was found that the two-parameter SARM showed improved fit compared to the one-parameter SARM in both data sets.
Archive | 2013
Yi Song; Paul Deane; Edith Aurora Graf; Peter W. van Rijn
British Journal of Mathematical and Statistical Psychology | 2015
Peter W. van Rijn; Frank Rijmen
ETS Research Report Series | 2012
Peter W. van Rijn; Frank Rijmen
Journal of Educational Measurement | 2018
Hongwen Guo; Paul Deane; Peter W. van Rijn; Mo Zhang; Randy Elliot Bennett
ETS Research Report Series | 2018
Peter W. van Rijn; Edith Aurora Graf; Meirav Arieli-Attali; Yi Song
ETS Research Report Series | 2018
Peter W. van Rijn; Usama S. Ali
Journal of Educational Measurement | 2017
Dries Debeer; Usama S. Ali; Peter W. van Rijn