Philip R. Armstrong

Thermal history sensing inside high-explosive environments using thermoluminescent microparticles

Thermoluminescent LiF:Mg,Ti (TLD-100) microparticle sensors are demonstrated to record the thermal history of the region near a detonated high explosive. Microparticles were gamma-irradiated to fill their charge-carrier traps and then exposed to the detonation of 20 g of a plastic bonded explosive formulation containing HMX and Al particles at a test distance of approximately 22 cm from the center of the detonation. The thermal history was reconstructed by measuring the thermoluminescent signature of the traps and matching it to appropriate models. The trap populations derived from luminescence measurements and modeling indicate that the particles experienced a maximum temperature of 240 °C, then cooled to 1 °C above ambient temperature within 0.4 seconds. The resulting glow curve intensity is calculated to match the observed post-detonation signal to 3% averaged over the comparison values used for reconstruction.

Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement

Under low light conditions, high temperature measurements of luminescence are limited by the overlap of the thermal emission spectra and the luminescent emission spectra being measured. A solution to this is to have a heat source that can be designed not to emit in a certain wavelength range(s) by coating it with an interference multilayer. The multilayer effectively changes the emissivity of the heat source. Microheaters made from aluminum oxide platforms with platinum heating elements were coated with aluminum oxide and titanium oxide multilayers. This multilayer structure was used to measure the thermoluminescence of CaSO4:Ce,Tb up to 420°C. They also showed a thermal emission background 800 times lower at 600°C than the same microheater with no multilayer structure.

Reduced blackbody microheaters for measuring high temperature thermoluminescent glow curve peaks

Infrared-transparent microheaters have been constructed to reduce the background blackbody radiation produced by the heater. Among other applications, such heaters allow one to probe the high temperature peaks of thermoluminescent(TL) materials. The microheater consists of peripheral platinum heating elements on a mid-infrared transparent alumina platform. Alumina has a relatively low blackbody signal at high temperature for wavelengths less than 8μm. To test the reduced blackbody emission, an aperture was placed over the heating coils and then the transparent center of the microheater. The amount of infrared light transmitted through the aperture was reduced by 90% as the aperture moved from the highly emissive heater coils at 450°C to the largely transparent center at the same temperature.

Depth-dependent temperature effects on thermoluminescence in multilayers

It is well known that thermal gradients penetrating deep into a material can preserve a memory of the temperature history of the surface. To date, this concept has been largely applied in the earth sciences, but there are many applications where a memory of rapid thermal events would be useful. For example, multiple layers of thermoluminescent films could serve as temperature sensors that indicate temperature versus depth in a microfabricated structure. As an advance toward this goal, this paper examines the effect of nonuniform temperature profiles on the thermoluminescence of heterogeneous multilayers. A Nd:YAG laser is used to create a known thermal event and apply pulses of heat energy of varying duration to a metalized thermoluminescent multilayer composed of LiF:Mg,Ti and CaF2:Dy. The thermoluminescence of the system is measured before and after the applied laser pulse. To model the process, a finite-difference time-domain method is used to calculate the dynamic heat transfer, and the temperature di...

Reduction of thermal emission background in high temperature microheaters

High temperature microheaters have been designed and constructed to reduce the background thermal emission radiation produced by the heater. Such heaters allow one to probe luminescence with very low numbers of photons where the background emission would overwhelm the desired signal. Two methods to reduce background emission are described: one with low emission materials and the other with interference coating design. The first uses platforms composed of material that is transparent to mid-infrared light and therefore of low emissivity. Heating elements are embedded in the periphery of the heater. The transparent platform is composed of aluminum oxide, which is largely transparent for wavelengths less than about 8 μm. In the luminescent microscopy used to test the heater, an optical aperture blocks emission from the heating coils while passing light from the heated objects on the transparent center of the microheater. The amount of infrared light transmitted through the aperture was reduced by 90% as the aperture was moved from the highly emissive heater coils at 450 °C to the largely transparent center at the same temperature. The second method uses microheaters with integrated multilayer interference structures designed to limit background emission in the spectral range of the low-light luminescence object being measured. These heaters were composed of aluminum oxide, titanium dioxide, and platinum and were operated over a large range of temperatures, from 50 °C to 600 °C. At 600 °C, they showed a background photon emission only 1/800 that of a comparison heater without the multilayer interference structure. In this structure, the radiation background was sufficiently reduced to easily monitor weak thermoluminescent emission from CaSO4:Ce,Tb microparticles.

Microheater controlled part-per-million-level absorption measurements using Photothermal Common Path Interferometry

Free carrier absorption is a major component of the laser-induced breakdown of optical materials. Free carriers mediate intense absorption of incident laser light, and the resulting heat transfers to the lattice, generating more carriers, creating a catastrophic runaway process. Unfortunately, measurements at very low levels of free carriers relevant to laser breakdown are very difficult, particularly when measurements must be taken at highly elevated temperatures. This paper describes a photothermal common path interferometer (PCI) system that is enhanced by use of micromachined heaters to control local substrate temperatures. The temperature dependence of the free carrier absorption of aluminum oxide and silicon are measured. The aluminum oxide is shown to have essentially no variation in absorption with temperature up to 700K, but silicon shows an exponential increase as would be expected by the relative sizes of their bandgaps.

Alteration by repeated electrostatic MEMS actuation of the thermoluminescence of thin films

The thermoluminescence characteristics of a thin film of terbium-doped yttrium oxide change upon repeated stress application through electrostatic actuation. A maximum 42% decrease in the intensity of two thermoluminescent peaks is seen when voltage is applied in 5V increments to 25V, translating to 0.15 μm of center deflection. While the overall intensity decreases, the higher temperature peak - corresponding to deeper traps - is affected more than the lower temperature one. Two possible physical explanations for the behavior are mechanical stress and dielectric charging.