Pranav Garg
Pennsylvania State University
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Publication
Featured researches published by Pranav Garg.
IEEE Transactions on Electron Devices | 2008
Mash-hud Iqbal; Yi Hong; Pranav Garg; Florin Udrea; Piero Migliorato; Stephen J. Fonash
Recently, we proposed and experimentally demonstrated a very simply structured unipolar accumulation-type field- effect transistor (FET) using silicon nanowires (NWs). In this paper, we present an extensive numerical study of this accumulation metal-oxide-semiconductor FET (AMOSFET). This single-doping-type ohmically contacted structure relies on having a nanoscale dimension normal to the gate, thereby forcing the current path through an accumulated (ON-state) or depleted (OFF-state) region. It also relies on having contact-barrier and doping-dependent minimum source and drain lengths as well as minimum gate lengths to insure unipolar transistor action. The comprehensive report presented extends our previous examination of the devices operation by using extensive numerical simulations to offer a greater understanding of the origins of transistor operation. We explore a wide range of structural and material parameters to study their effects on the linear, saturation, and OFF-state currents. We also delve deeper into the uniquely weak dependence on gate capacitance. This paper establishes that this extremely simple accumulation-mode transistor structure offers its best performance for the more highly doped thinnest devices, giving, for example, for a 1017-cm-3 (doping) and 20-nm device a leakage current of ~40-17 A/mum, a subthreshold swing of 65 mV/dec, and an on-off ratio approximately 1010. This paper also shows that such results should be attainable for AMOSFETs fabricated using NWs and nanoribbons, as well as nanoscale thin-film materials.
ASME 2007 International Manufacturing Science and Engineering Conference | 2007
Wook Jun Nam; H. Carrion; P. Park; Pranav Garg; Sanjay Joshi; Stephen J. Fonash
A novel fabrication approach for forming precisely positioned nanowire array structures is introduced. The approach is suitable for potentially economical and environmentally safe manufacturing. For the demonstration of this approach, 100nm wide Sn nanowires and 150nm wide polyaniline (PANI) nanowires were synthesized using an electro-chemical deposition technique and a process we term the step-and-grow method. The nanowires produced exhibit the expected properties. For example, synthesized PANI nanowires showed reasonable ranges of electrical conductivities (e.g., 25S/cm for a 200nm wide, 200nm high, 10um long nanowire), and formed ohmic contact with electrodes on a substrate. It is shown that the polydimethylsiloxane (PDMS) stepping template mold used for our step-and-grow nanowire synthesis process can be used at least up to 40 times without degradation.Copyright
International Journal of Refractory Metals & Hard Materials | 2007
Pranav Garg; Seong-Jin Park; Randall M. German
Archive | 2006
Sanjay Joshi; Stephen J. Fonash; Wook Jun Nam; Pranav Garg
218th ECS Meeting | 2010
Jian Wu; Pranav Garg; Stephen J. Fonash
2014 ECS and SMEQ Joint International Meeting (October 5-9, 2014) | 2014
Wook Jun Nam; Suxing Pan; Pranav Garg; Stephen J. Fonash
Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors 3 | 2011
Jian Wu; Pranav Garg; Suxing Pan; Chris Winter; Dana Scott; Stephen J. Fonash
Meeting Abstracts | 2010
Pranav Garg; Jian Wu; Stephen J. Fonash
217th ECS Meeting | 2010
Pranav Garg; Jian Wu; Stephen J. Fonash
Meeting Abstracts | 2009
Pranav Garg; Jian Wu; Yi Hong; Mash-hud Iqbal; Piero Migliorato; Stephen J. Fonash