Q. Xia

AGIPD, a high dynamic range fast detector for the European XFEL

AGIPD—(Adaptive Gain Integrating Pixel Detector) is a hybrid pixel X-ray detector developed by a collaboration between Deutsches Elektronen-Synchrotron (DESY), Paul-Scherrer-Institut (PSI), University of Hamburg and the University of Bonn. The detector is designed to comply with the requirements of the European XFEL. The radiation tolerant Application Specific Integrated Circuit (ASIC) is designed with the following highlights: high dynamic range, spanning from single photon sensitivity up to 104 12.5keV photons, achieved by the use of the dynamic gain switching technique using 3 possible gains of the charge sensitive preamplifier. In order to store the image data, the ASIC incorporates 352 analog memory cells per pixel, allowing also to store 3 voltage levels corresponding to the selected gain. It is operated in random-access mode at 4.5MHz frame rate. The data acquisition is done during the 99.4ms between the bunch trains. The AGIPD has a pixel area of 200× 200 μ m2 and a 500μ m thick silicon sensor is used. The architecture principles were proven in different experiments and the ASIC characterization was done with a series of development prototypes. The mechanical concept was developed in the close contact with the XFEL beamline scientists and is now being manufactured. A first single module system was successfully tested at APS.

Towards AGIPD1.0: optimization of the dynamic range and investigation of a pixel input protection

AGIPD is a charge integrating, hybrid pixel readout ASIC, which is under development for the European XFEL [1,2]. A dynamic gain switching logic at the output of the preamplifier (preamp) is used to provide single photon resolution as well as covering a dynamic range of at least 104·12.4 keV photons [3,4]. Moreover, at each point of the dynamic range the electronics noise should be lower than the Poisson fluctuations, which is especially challenging at the points of gain switching. This paper reports on the progress of the chip design on the way to the first full-scale chip AGIPD1.0, focusing on the optimization of the dynamic range and the implementation of protection circuits at the preamplifier input to avoid pixel destruction due to high intense spots.

The adaptive gain integrating pixel detector

The adaptive gain integrating pixel detector (AGIPD) is a development of a collaboration between Deustsches Elektronen-Synchrotron (DESY), the Paul-Scherrer-Institute (PSI), the University of Hamburg and the University of Bonn. The detector is designed to cope with the demanding challenges of the European XFEL. Therefore it comes along with an adaptive gain stage allowing a high dynamic range, spanning from single photon sensitivity to 104 × 12.4 keV photons and 352 analogue memory cells per pixel. The aim of this report is to briefly explain the concepts of the AGIPD electronics and mechanics and then present recent experiments demonstrating the functionality of its key features.

PERCIVAL: The design and characterisation of a CMOS image sensor for direct detection of low-energy X-rays

Free-Electron Lasers and Synchrotrons are rapidly increasing in brilliance. This has led a requirement of large dynamic range and high frame rate sensors that is now being fulfilled by the PERCVIAL CMOS imager for direct X-ray detection developed at Rutherford Appleton Laboratory. Utilising a lateral overflow pixel and back-side illumination, PERCIVAL simultaneously achieves low-noise single-photon detection and high full well up to 107 e-, all while maintaining a frame rate of 120Hz. PERCIVAL is currently in test structure stage, and will be produced in 2 Mpixel and 13 Mpixel “waferscale” variants in 2015.

On the Charge Collection Efficiency of the PERCIVAL Detector

The PERCIVAL soft X-ray imager is being developed by DESY, RAL, Elettra, DLS, and PAL to address the challenges at high brilliance Light Sources such as new-generation Synchrotrons and Free Electro ...

Report on recent results of the PERCIVAL soft X-ray imager

The PERCIVAL (Pixelated Energy Resolving CMOS Imager, Versatile And Large) soft X-ray 2D imaging detector is based on stitched, wafer-scale sensors possessing a thick epi-layer, which together with back-thinning and back-side illumination yields elevated quantum efficiency in the photon energy range of 125–1000 eV. Main application fields of PERCIVAL are foreseen in photon science with FELs and synchrotron radiation. This requires high dynamic range up to 105 ph @ 250 eV paired with single photon sensitivity with high confidence at moderate frame rates in the range of 10–120 Hz. These figures imply the availability of dynamic gain switching on a pixel-by-pixel basis and a highly parallel, low noise analog and digital readout, which has been realized in the PERCIVAL sensor layout. Different aspects of the detector performance have been assessed using prototype sensors with different pixel and ADC types. This work will report on the recent test results performed on the newest chip prototypes with the improved pixel and ADC architecture. For the target frame rates in the 10–120 Hz range an average noise floor of 14e− has been determined, indicating the ability of detecting single photons with energies above 250 eV. Owing to the successfully implemented adaptive 3-stage multiple-gain switching, the integrated charge level exceeds 4 10^6 e− or 57000 X-ray photons at 250 eV per frame at 120 Hz. For all gains the noise level remains below the Poisson limit also in high-flux conditions. Additionally, a short overview over the updates on an oncoming 2 Mpixel (P2M) detector system (expected at the end of 2016) will be reported.

Front end ASIC for AGIPD, a high dynamic range fast detector for the European XFEL

The Adaptive Gain Integrating Pixel Detector (AGIPD) is a hybrid pixel X-ray detector for the European-XFEL. One of the detectors important parts is the radiation tolerant front end ASIC fulfilling the European-XFEL requirements: high dynamic range—from sensitivity to single 12.5keV-photons up to 104 photons. It is implemented using the dynamic gain switching technique with three possible gains of the charge sensitive preamplifier. Each pixel can store up to 352 images in memory operated in random-access mode at ≥4.5 MHz frame rate. An external vetoing may be applied to overwrite unwanted frames.

New calibration circuitry and concept for AGIPD

AGIPD (adaptive gain integrating pixel detector) is a detector system developed for the European XFEL (XFEL.EU), which is currently being constructed in Hamburg, Germany. The XFEL.EU will operate with bunch trains at a repetition rate of 10 Hz. Each train consists of 2700 bunches with a temporal separation of 220 ns corresponding to a rate of 4.5 MHz. Each photon pulse has a duration of < 100 fs (rms) and contains up to 1012 photons in an energy range between 0.25 and 25 keV . In order to cope with the large dynamic range, the first stage of each bump-bonded AGIPD ASIC is a charge sensitive preamplifier with three different gain settings that are dynamically switched during the charge integration. Dynamic gain switching allows single photon resolution in the high gain stage and can cover a dynamic range of 104 × 12.4 keV photons in the low gain stage. The burst structure of the bunch trains forces to have an intermediate in-pixel storage of the signals. The full scale chip has 352 in-pixel storage cells inside the pixel area of 200 × 200 μm2. This contribution will report on the measurements done with the new calibration circuitry of the AGIPD1.1 chip (without sensor). These results will be compared with the old version of the chip (AGIPD1.0). A new calibration method (that is not AGIPD specific) will also be shown.

AGIPD: a multi megapixel, multi megahertz X-ray camera for the European XFEL

AGIPD is a hybrid pixel detector developed by DESY, PSI, and the Universities of Bonn and Hamburg. It is targeted for use at the European XFEL, a source with unique properties: a train of up to 2700 pulses is repeated at 10 Hz rate. The pulses inside a train are ≤100fs long and separated by 220 ns, containing up to 1012 photons of 12.4 keV each. The readout ASICs with 64 x 64 pixels each have to cope with these properties: Single photon sensitivity and a dynamic range up to ⪆104 photons/pixel in the same image as well as storage for as many as possible images of a pulse train for delayed readout, prior to the next train. The high impinging photon flux also requires a very radiation hard design of sensor and ASIC, which uses 130 nm CMOS technology and radiation tolerant techniques. The signal path inside a pixel of the ASIC consists of a charge sensitive preamplifier with 3 individual gains, adaptively selected by a subsequent discriminator. The preamp also feeds to a correlated double sampling stage, which writes to an analogue memory to record 352 frames. It is random-access, so it can be used most efficiently by overwriting bad or empty images. Encoded gain information is stored to a similar memory. Readout of these memories is via a common charge sensitive amplifier in each pixel, and multiplexers on four differential ports. Operation of the ASIC is controlled via a command interface, using 3 LVDS lines. It also serves to configure the chip’s operational parameters and timings.

The AGIPD 1.0 ASIC: Random access high frame rate, high dynamic range X-ray camera readout for the European XFEL

The European XFEL is an extremely brilliant Free Electron Laser Source with a very demanding pulse structure: trains of 2700 X-Ray pulses are repeated at 10 Hz. The pulses inside the train are spaced by 220 ns and each one contains up to 1012 photons of 12.4 keV, while being ≤ 100 fs in length. AGIPD (Adaptive Gain Integrating Pixel Detector) is a hybrid 1M-pixel detector developed by DESY, PSI, and the Universities of Bonn and Hamburg to cope with these properties. Thus the readout ASIC has to provide not only single photon sensitivity and a dynamic range ≳ 104 photons/pixel in the same image but also a memory for as many images of a pulse train as possible for delayed readout prior to the next train. The AGIPD 1.0 ASIC uses a 130 nm CMOS technology and radiation tolerant techniques to withstand the radiation damage incurred by the high impinging photon flux. Each ASIC contains 64 × 64 pixels of 200μmχ200μm. The circuit of each pixel contains a charge sensitive preamplifier with threefold switchable gain, a discriminator for an adaptive gain selection, and a correlated double sampling (CDS) stage to remove reset and low-frequency noise components. The output of the CDS, as well as the dynamically selected gain is sampled in a capacitor-based analogue memory for 352 samples, which occupies about 80% of a pixels area. For readout each pixel features a charge sensitive buffer. A control circuit with a command based interface provides random access to the memory and controls the row-wise readout of the data via multiplexers to four differential analogue ports. The AGIPD 1.0 full scale ASIC has been received back from the foundry in fall of 2013. Since then it has been extensively characterised also with a sensor as a single chip and in 2 × 8-chip modules for the AGIPD 1 Mpix detector. We present the design of the AGIPD 1.0 ASIC along with supporting results, also from beam tests at PETRA III and APS, and show changes incorporated in the recently taped out AGIPD 1.1 ASIC upgrade.