Raffael Schnell

BIGT control optimisation for overall loss reduction

In this paper we present the latest results of utilizing MOS-control (MOSctrl) to optimize the performance of the Bi-mode Insulated Gate Transistor (BIGT) chip. The adaption of the BIGT technology enables higher output power per footprint. However, to enable the full performance benefit of the BIGT, the optimisation of the known standard MOS gate control is necessary. This optimisation is being demonstrated over the whole current and temperature range for the BIGT diode turn-off and BIGT turn-on operation. It is shown that the optimum control can offer a performance increase up to 20% for high voltage devices.

The next generation high voltage IGBT modules utilizing Enhanced-Trench ET-IGBTs and Field Charge Extraction FCE-Diodes

In this paper, we present the next generation of IGBT modules employing the latest Enhanced Trench ET-IGBT and Field Charge Extraction FCE fast diode devices. Such technologies enable high power IGBT modules to be capable of providing higher level of electrical performance in terms of low losses, good controllability, high robustness and soft diode reverse recovery. The first prototype dual modules with the new chip technologies rated at 300A and 3300V were fabricated and tested. The paper will present in detail the ET-IGBT and FCE diode concepts, the full static and dynamic electrical test results and their impact for achieving higher levels of performance in future power electronics applications.