Ramesh Karri
New York University
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Publication
Featured researches published by Ramesh Karri.
IEEE Computer | 2010
Ramesh Karri; Jeyavijayan Rajendran; Kurt Rosenfeld; Mohammad Tehranipoor
For reasons of economy, critical systems will inevitably depend on electronics made in untrusted factories. A proposed new hardware Trojan taxonomy provides a first step in better understanding existing and potential threats.
international test conference | 2004
Bo Yang; Kaijie Wu; Ramesh Karri
Scan based test is a double edged sword. On one hand, it is a powerful test technique. On the other hand, it is an equally powerful attack tool. We show that scan chains can be used as a side channel to recover secret keys from a hardware implementation of the Data Encryption Standard (DES). By loading pairs of known plaintexts with one-bit difference in the normal mode and then scanning out the internal state in the test mode, we first determine the position of all scan elements in the scan chain. Then, based on a systematic analysis of the structure of the nonlinear substitution boxes, and using three additional plaintexts we discover the DES secret key. Finally, some assumptions in the attack are discussed.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2006
Bo Yang; Kaijie Wu; Ramesh Karri
Scan-based design for test (DFT) is a powerful testing scheme, but it can be used to retrieve the secrets stored in a crypto chip, thus compromising its security. On one hand, sacrificing the security for testability by using a traditional scan-based DFT restricts its use in privacy sensitive applications. On the other hand, sacrificing the testability for security by abandoning the scan-based DFT hurts the product quality. The security of a crypto chip comes from the small secret key stored in a few registers, and the testability of a crypto chip comes from the data path and control path implementing the crypto algorithm. Based on this key observation, the authors propose a novel scan DFT architecture called secure scan that maintains the high test quality of traditional scan DFT without compromising the security. They used a hardware implementation of the advanced encryption standard to show that the traditional scan DFT scheme can compromise the secret key. They then showed that by using secure-scan DFT, neither the secret key nor the testability of the AES implementation is compromised
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2002
Ramesh Karri; Kaijie Wu; Piyush Mishra; Yongkook Kim
Fault-based side-channel cryptanalysis is very effective against symmetric and asymmetric encryption algorithms. Although straightforward hardware and time redundancy-based concurrent error detection (CED) architectures can be used to thwart such attacks, they entail significant overheads (either area or performance). The authors investigate systematic approaches to low-cost low-latency CED techniques for symmetric encryption algorithms based on inverse relationships that exist between encryption and decryption at algorithm level, round level, and operation level and develop CED architectures that explore tradeoffs among area overhead, performance penalty, and fault detection latency. The proposed techniques have been validated on FPGA implementations of Advanced Encryption Standard (AES) finalist 128-bit symmetric encryption algorithms.
design automation conference | 2012
Jeyavijayan Rajendran; Youngok Pino; Ozgur Sinanoglu; Ramesh Karri
Due to globalization of Integrated Circuit (IC) design flow, rogue elements in the supply chain can pirate ICs, overbuild ICs, and insert hardware trojans. EPIC [1] obfuscates the design by randomly inserting additional gates; only a correct key makes the design to produce correct outputs. We demonstrate that an attacker can decipher the obfuscated nctlist, in a time linear to the number of keys, by sensitizing the key values to the output. We then develop techniques to fix this vulnerability and make obfuscation truly exponential in the number of inserted keys.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2007
Kyosun Kim; Kaijie Wu; Ramesh Karri
Quantum-dot cellular automata (QCA) is attracting a lot of attention due to its extremely small feature size and ultralow power consumption. Up to now, several adder designs using QCA technology have been proposed. However, it was found that not all of the designs function properly. This paper analyzes the reasons of the failures and proposes adders that exploit proper clocking schemes
computer and communications security | 2013
Jeyavijayan Rajendran; Michael Sam; Ozgur Sinanoglu; Ramesh Karri
Camouflaging is a layout-level technique that hampers an attacker from reverse engineering by introducing, in one embodiment, dummy contacts into the layout. By using a mix of real and dummy contacts, one can camouflage a standard cell whose functionality can be one of many. If an attacker cannot resolve the functionality of a camouflaged gate, he/she will extract an incorrect netlist. In this paper, we analyze the feasibility of identifying the functionality of camouflaged gates. We also propose techniques to make the dummy contact-based IC camouflaging technique resilient to reverse engineering. Furthermore, we judiciously select gates to camouflage by using techniques which ensure that the outputs of the extracted netlist are controllably corrupted. The techniques leverage IC testing principles such as justification and sensitization. The proposed techniques are evaluated using ISCAS benchmark circuits and OpenSparc T1 microprocessor controllers.
Proceedings of the IEEE | 2014
Masoud Rostami; Farinaz Koushanfar; Ramesh Karri
The multinational, distributed, and multistep nature of integrated circuit (IC) production supply chain has introduced hardware-based vulnerabilities. Existing literature in hardware security assumes ad hoc threat models, defenses, and metrics for evaluation, making it difficult to analyze and compare alternate solutions. This paper systematizes the current knowledge in this emerging field, including a classification of threat models, state-of-the-art defenses, and evaluation metrics for important hardware-based attacks.
international test conference | 2004
Kaijie Wu; Ramesh Karri; Grigori Kuznetsov; Michael Goessel
We present a new low-cost concurrent checking method for the advanced encryption standard (AES) encryption algorithm. In this method, the parity of the 128-bit input is determined and modified step-by-step into the parity of the 128-bit output according to the processing steps of the AES encryption. For the parity-preserving AES steps shift-rows and mix-column no parity modifications are necessary. The modified parity is compared in any round with the actual parity of the outputs of the round. To obtain the hardware costs we implemented this method on a Xilinx Virtex 1000 FPGA. For this implementation, the hardware overhead is about 8% and the additional time delay is about 5%. The method detects technical faults and deliberately injected faults during normal operation.
cryptographic hardware and embedded systems | 2003
Ramesh Karri; Grigori Kuznetsov; Michael Goessel
Deliberate injection of faults into cryptographic devices is an effective cryptanalysis technique against symmetric and asymmetric encryption algorithms. In this paper we will describe parity code based concurrent error detection (CED) approach against such attacks in substitution-permutation network (SPN) symmetric block ciphers [22]. The basic idea compares a carefully modified parity of the input plain text with that of the output cipher text resulting in a simple CED circuitry. An analysis of the SPN symmetric block ciphers reveals that on one hand, permutation of the round outputs does not alter the parity from its input to its output. On the other hand, exclusive-or with the round key and the non-linear substitution function (s-box) modify the parity from their inputs to their outputs. In order to change the parity of the inputs into the parity of outputs of an SPN encryption, we exclusive-or the parity of the SPN round function output with the parity of the round key. We also add to all s-boxes an additional 1-bit binary function that implements the combined parity of the inputs and outputs to the s-box for all its (input, output) pairs. These two modifications are used only by the CED circuitry and do not impact the SPN encryption or decryption. The proposed CED approach is demonstrated on a 16-input, 16-output SPN symmetric block cipher from [1].