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Ray Beffa

Micron Technology

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Publication

Featured researches published by Ray Beffa.

Archive | 1997

Self-test of a memory device

Ray Beffa; William K. Waller; Eugene H. Cloud; Warren M. Farnworth; Leland R. Nevill

Archive | 1999

Wafer level burn-in of memory integrated circuits

Ray Beffa; Leland R. Nevill; Warren M. Farnworth; Eugene H. Cloud; William K. Waller

Archive | 1997

Apparatus and method implementing repairs on a memory device

Ray Beffa; William K. Waller; Lee R. Nevill; Warren M. Farnworth; Eugene H. Cloud

Archive | 1997

Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devices

Ray Beffa

Archive | 1998

Data compression circuit and method for testing memory devices

Ray Beffa; Leland R. Nevill; Neil L. Hansen; Eugene H. Cloud

Archive | 1998

Self-test circuit for memory integrated circuits

Leland R. Nevill; Ray Beffa; Warren M. Farnworth; Gene Cloud

Archive | 1999

Method and apparatus for testing an integrated circuit including the step/means for storing an associated test identifier in association with integrated circuit identifier for each test to be performed on the integrated circuit

Ray Beffa

Archive | 1999

Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device

Ray Beffa

Archive | 1997

System for stressing a memory integrated circuit die

Ray Beffa; Leland R. Nevill; Warren M. Farnworth; Eugene H. Cloud; William K. Waller

Archive | 1996

Method of stress testing memory integrated circuits

Ray Beffa; Leland R. Nevill; Warren M. Farnworth; Eugene H. Cloud; William K. Waller

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Collaboration

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Eugene H. Cloud

Micron Technology

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Leland R. Nevill

Micron Technology

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Warren M. Farnworth

Micron Technology

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William K. Waller

Micron Technology

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Ken Waller

Micron Technology

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Russell Meyer

Micron Technology

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Gene Cloud

Micron Technology

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Lee R. Nevill

Micron Technology

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Neil L. Hansen

Micron Technology

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