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Dive into the research topics where Robert W. Berry is active.

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Featured researches published by Robert W. Berry.


IEEE Micro | 2013

Active Guardband Management in Power7+ to Save Energy and Maintain Reliability

Charles R. Lefurgy; Alan J. Drake; Michael Stephen Floyd; Malcolm S. Allen-Ware; Bishop Brock; Jose A. Tierno; John B. Carter; Robert W. Berry

Microprocessor voltage levels traditionally include substantial margin to ensure reliable operation despite variations in manufacturing, workload, and environmental parameters. This margin allows the microprocessor to function correctly during worst-case conditions, but during typical operation it is larger than necessary and wastes energy. The authors present a mechanism that reduces excess voltage margin by introducing a critical-path monitor (CPM) circuit that measures available timing margin in real time; coupling the CPM output to the clock generation circuit to rapidly adjust clock frequency in response to excess or inadequate timing margin; and adjusting the processor voltage level periodically in firmware to achieve a specified average clock frequency target. They first demonstrated this mechanism in an IBM Power7 server and proved its effectiveness in the Power7+ product. Power consumption on the VDD rail was reduced by 11 percent for SPEC CPU2006 workloads with negligible performance loss yet increased protection against noise events.


symposium on vlsi circuits | 2012

Voltage droop reduction using throttling controlled by timing margin feedback

Michael Stephen Floyd; Alan J. Drake; Robert W. Berry; Harold W. Chase; Richard L. Willaman; Jarom Pena

An active processor throttling control loop using critical path timing measurements is enabled in the shipping POWER7™ based P775 supercomputer to prevent voltage droop induced failures. As a result, worst-case workload-induced voltage droop events are reduced by more than 50% compared to the system operating without the control loop. The reduction in operating voltage afforded by this technique translates to significant yield improvement, reduced failure rates, and improved power efficiency.


Ibm Journal of Research and Development | 2013

Runtime power reduction capability of the IBM POWER7+ chip

Michael Stephen Floyd; Alan J. Drake; Nicole S. Schwartz; Robert W. Berry; Charles R. Lefurgy; Malcolm Scott Ware; Karthick Rajamani; Victor Zyuban; Richard L. Willaman; Ruby M. Zgabay

Four new energy management features in the POWER7+™ chip enable larger reductions in chip power consumption and further increase energy efficiency of the system during runtime compared with prior POWER7® systems. First, per-core power gating reduces idle power consumption by allowing the system to turn off the voltage to the processor cores when they are not being used. Second, real-time measurement and control of operational guardband allows for higher maximum clock frequency as well as better dynamic voltage selection to reduce power. Third, per-thread utilization counters enable the firmware to sense processor utilization on a finer granularity and set per-core frequency targets with greater accuracy. Finally, a per-core memory access counter allows firmware to more accurately account for power consumption and budget it on a per-processor core basis. These hardware capabilities together enable new EnergyScale™ firmware functions that include voltage optimization to achieve higher turbo frequencies under stressful environmental conditions, automated idle state detection and management, per-core adaptive frequency scaling, and online power modeling for real-time estimation of energy savings.


custom integrated circuits conference | 2007

Implementation of the 65nm Cell Broadband Engine

Mack W. Riley; Brian Flachs; Sang Hoo Dhong; Gilles Gervais; Steve Weitzel; Michael Wang; David William Boerstler; Mark Bolliger; John M. Keaty; Jürgen Pille; Robert W. Berry; Osamu Takahashi; Yoichi Nishino; T. Uchino

The first generation cell broadband engine processor introduced the cell architecture that consists of nine processor cores fabricated in the 90 nm CMOS SOI technology. This paper describes the advances made by moving the cell broadband engine design from 90 nm CMOS SOI to 65 nm CMOS SOI.


Archive | 2007

Method and Apparatus for Power Throttling a Processor in an Information Handling System

Robert W. Berry; Charles Ray Johns; Christopher J. Kuruts


Archive | 1997

Pattern generator for memory burn-in and test

Robert W. Berry


Archive | 1995

Programmable built-in self test method and controller for arrays

Philip George Shephard; William V. Huott; Paul R. Turgeon; Robert W. Berry; Gulsun Yasar; Frederick J. Cox; Pradip Patel; Joseph B. Hanley


Archive | 1993

Method and apparatus for memory dynamic burn-in and test.

Robert W. Berry; Bernd Koenemann; William J. Scarpero; Philip George Shephard; Kenneth D. Wagner; Gulsun Yasar


Archive | 1992

Delay test coverage enhancement for logic circuitry employing level sensitive scan design

Robert W. Berry; Jacob Savir


Archive | 2005

Booting multiple processors with a single flash ROM

Robert W. Berry; Christopher R. Conley; Michael Criscolo; Michael Timothy Saunders

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