Robert Wiesner
Infineon Technologies
Network
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Publication
Featured researches published by Robert Wiesner.
international on-line testing symposium | 2017
Ulrich Backhausen; Oscar Bailan; Paolo Bemardi; Sergio De Luca; Julie Henzler; Thomas Kern; Davide Piumatti; Thomas Rabenalt; Krishnapriya Chakiat Ramamoorthy; Ernesto Sánchez; A. Sansonetti; Rudolf Ullmann; Federico Venini; Robert Wiesner
Different perspectives about the concept of Robustness in Automotive Electronic are provides by leading edge semiconductor manufacturer. Xilinx contribution is related to the development and evaluation of Software Test Libraries suitable for in-field testing of the interconnect blocks in large SoCs. Infineon (IFX) section is discussing safety and security concerns of On-Line FLASH Memory Repair. STMicroelectronics is providing guidelines for the development and integration of Core Self-Test libraries.
Archive | 2008
Robert Strenz; Wolfram Langheinrich; Mayk Roehrich; Robert Wiesner
Archive | 2010
Simon Brewerton; Neil Stuart Hastie; Paul Hubbert; Klaus Oberlaender; Robert Wiesner; Antonio Vilela; Alfred Eder; Glenn Ashley Farrall
Archive | 2013
Christian Peters; Mihail Jefremow; Jan Otterstedt; Wolf Allers; Robert Wiesner
Archive | 2001
Franz Hofmann; Georg Tempel; Robert Strenz; Robert Wiesner
Microelectronics Reliability | 2017
Rainer Duschl; Armin Fischer; Achim Gratz; Robert Wiesner
Archive | 2013
Wolf Allers; Mihail Jefremow; Jan Otterstedt; Christian Peters; Robert Wiesner
Archive | 2012
Simon Brewerton; Neil Stuart Hastie; Alfred Eder; Glenn Ashley Farrall; Paul Hubbert; Klaus Oberlaender; Antonio Vilela; Robert Wiesner
Archive | 2012
Robert Wiesner; Rudolf Ullmann; Walter Mischo; Jens Rosenbusch
Archive | 2011
Simon Brewerton; Neil Stuart Hastie; Alfred Eder; Glenn Ashley Farrall; Paul Hubbert; Klaus Oberlaender; Antonio Vilela; Robert Wiesner
