Ruoyu Chen

Enhanced noise at high bias in atomic-scale Au break junctions.

Heating in nanoscale systems driven out of equilibrium is of fundamental importance, has ramifications for technological applications, and is a challenge to characterize experimentally. Prior experiments using nanoscale junctions have largely focused on heating of ionic degrees of freedom, while heating of the electrons has been mostly neglected. We report measurements in atomic-scale Au break junctions, in which the bias-driven component of the current noise is used as a probe of the electronic distribution. At low biases (<150 mV) the noise is consistent with expectations of shot noise at a fixed electronic temperature. At higher biases, a nonlinear dependence of the noise power is observed. We consider candidate mechanisms for this increase, including flicker noise (due to ionic motion), heating of the bulk electrodes, nonequilibrium electron-phonon effects, and local heating of the electronic distribution impinging on the ballistic junction. We find that flicker noise and bulk heating are quantitatively unlikely to explain the observations. We discuss the implications of these observations for other nanoscale systems, and experimental tests to distinguish vibrational and electron interaction mechanisms for the enhanced noise.

Shot noise variation within ensembles of gold atomic break junctions at room temperature

Atomic-scale junctions are a powerful tool to study quantum transport, and are frequently examined through the mechanically controllable break junction technique. The junction-to-junction variation of atomic configurations often leads to a statistical approach, with ensemble-averaged properties providing access to the relevant physics. However, the full ensemble contains considerable additional information. We report a new analysis of shot noise over entire ensembles of junction configurations using scanning tunneling microscope-style gold break junctions at room temperature in ambient conditions, and compare these data with simulations based on molecular dynamics, a sophisticated tight-binding model, and nonequilibrium Greens functions. The experimental data show a suppression in the variation of the noise near conductances dominated by fully transmitting channels, and a surprising participation of multiple channels in the nominal tunneling regime. Comparison with the simulations, which agree well with published work at low temperatures and ultrahigh vacuum conditions, suggests that these effects likely result from surface contamination and disorder in the electrodes. We propose additional experiments that can distinguish the relative contributions of these factors.

Noise in electromigrated nanojunctions

Noise measurements are a probe beyond simple electronic transport that can reveal additional information about electronic correlations and inelastic processes. Here we report noise measurements in individual electromigrated nanojunctions, examining the evolution from the many channel regime to the tunneling regime, using a radio frequency technique. While we generally observe the dependence of noise on bias expected for shot noise, in approximately 12% of junction configurations we find discrete changes in the bias dependence at threshold values of the bias, consistent with electronic excitation of local vibrational modes. Moreover, with some regularity we find significant mesoscopic variation in the magnitude of the noise in particular junctions even with small changes in the accompanying conductance. In another

Evolution of shot noise in suspended lithographic gold break junctions with bias and temperature

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Excess noise in STM-style break junctions at room temperature

17% of junctions we observe pronounced asymmetries in the inferred noise magnitude as a function of bias polarity, suggesting that investigators should be concerned about current-driven ionic motion in the electrodes even at biases well below those used for deliberate electromigration.

Current noise enhancement: channel mixing and possible nonequilibrium phonon backaction in atomic-scale Au junctions.

Shot noise is a powerful tool to probe correlations and microscopic transport details that conductance measurements alone cannot reveal. Even in atomic-scale Au devices that are well described by Landauer-Büttiker physics, complications remain such as local heating and electron-phonon interactions. We report systematic rf measurements of shot noise in individual atomic-scale gold break junctions at multiple temperatures, with most bias voltages well above the energy of the Au optical phonon mode. Motivated by the previous experimental evidence that electron-phonon interactions can modify Fano factors and result in kinked features in bias dependence of shot noise, we find that the temperature dependence of shot noise from 4.2 to 100 K is minimal. Enhanced Fano factors near [Formula: see text] and features beyond simply linear bias dependence of shot noise near the [Formula: see text] plateau are observed. Both are believed to have non-interacting origins and the latter likely results from slightly bias-dependent transmittance of the dominant quantum channel.