Ryozo Kitoh
Ube Industries
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Publication
Featured researches published by Ryozo Kitoh.
Japanese Journal of Applied Physics | 1993
Koichi Fukuda; Ryozo Kitoh; Ikuo Awai
The microwave characteristics of the binary-system TiO2-Bi2O3 ceramics, which is widely known to exhibit a comparatively high dielectric constant in the lower-frequency band, are investigated from a new standpoint. It is shown in this article that the composition of 0.919TiO2-0.081Bi2O3 has a high dielectric constant (er=80), high Q (1800 at 5 GHz) and low temperature coefficient of resonant frequency (τf=+21 ppm/°C). From the X-ray diffraction and X-ray microanalysis, it is indicated that the crystal structure of this material is composed of two phases, TiO2 and Bi2Ti4O11, which possess a high er with a negative temperature coefficient and a high er with a positive temperature coefficient, respectively. The measurements of linear thermal expansion and temperature coefficient of capacitance are also carried out in order to study the behavior of temperature compensation in this system.
Japanese Journal of Applied Physics | 1993
Koichi Fukuda; Itsuhiro Fujii; Ryozo Kitoh; Yasuo Cho; Ikuo Awai
The dielectric ceramic materials, 0.143BaO-0.714TiO2-0.143 rare earth oxides (REOx), have unique dielectric properties at microwave frequencies, which depend on the rare earth element (RE=Pr, Nd, Sm). In order to study the effect of the rare earth ions on dielectric properties, infrared reflection spectra of these ceramics were measured from 50 to 4000 cm-1 at room temperature. These data were analyzed according to the model proposed by Gervais and Piriou. Also, the fourth-order dielectric constants of these materials were estimated for the purpose of investigating the relationship between the dielectric loss and the anharmonic terms in the potential energy.
Journal of Materials Research | 1995
Koichi Fukuda; Ryozo Kitoh; Ikuo Awai
Microwave dielectric properties and microstructures of BaPr 2 Ti 4 O 12 and BaPr 2 Ti 5 O 14 ceramics which have extremely similar crystal structures, were investigated, including those of the solid solution represented by the formula of Ba 6− x Pr 8+2 x /3 Ti 18 O 54 ceramics. It is suggested that BaPr 2 Ti 5 O 14 ceramics are composed of mixed phases, approximately 85.0 vol. % Ba 4.05 Pr 9.3 Ti 18 O 54 ( x = 1.95), 8.1 vol. % TiO 2 , and 6.9 vol. % BaTi 4 O 9 . The microwave dielectric properties of the Ba 6− x Pr 8+2 x /3 Ti 18 O 54 system are strongly dependent on the x value, which is interesting for studying the relationship between microstructures and dielectric properties. Far infrared reflection spectra were also measured to study the mixed phases formed in these ceramics in more detail.
Journal of Materials Science | 1995
Koichi Fukuda; Ryozo Kitoh; Ikuo Awai
The microwave characteristics of the BaTi4O9-BaPr2Ti4O12 system were investigated, including its microstructure and infrared reflection spectroscopy. It was found that this system is entirely composed of two phases, BaTi4O9 and BaPr2Ti4O12, and it is suggested that the lattices of each phase are well matched obliquely at the interface in the sintered ceramics. The dielectric properties are compared with calculated values deduced from the mixing relations of the two components. Furthermore, the infrared reflection spectra of this system were analysed with the factorized form of the dielectric function, for the purpose of studying the applicability of the reflection analysis technique to this mixed phase system.
Journal of the American Ceramic Society | 1994
Koichi Fukuda; Ryozo Kitoh; Ikuo Awai
Archive | 1980
Sumio Umemura; Ryozo Kitoh; Taizo Uda
Archive | 1978
Sumio Umemura; Ryozo Kitoh; Shigeru Itoh; Yasutaka Arima; Kosuke Itoh; Hideaki Fukui
Archive | 1991
Ryozo Kitoh; Koichi Fukuda; Noriaki Arimura
Journal of Materials Science Letters | 1994
Koichi Fukuda; K. Shoda; A. Kunishinge; Ryozo Kitoh; Ikuo Awai
Electronics and Communications in Japan Part Ii-electronics | 1994
Atsunori Takasugi; Ryozo Kitoh; Ikuo Awai; Mitsuo Hano
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National Institute of Advanced Industrial Science and Technology
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