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Featured researches published by S.J. Prasad.


[1991] GaAs IC Symposium Technical Digest | 1991

A 45 GHz AlGaAs/GaAs HBT IC technology

S.J. Prasad; B. Vetanen; C. Haynes; S. Park; I. Beers; S. Diamond; G. Pubanz; John Ebner; S. Sanielevici; Agoston Agoston

A non-self-aligned HBT (heterojunction bipolar transistor) IC process with f/sub T/ and f/sub max/ of 45 GHz is reported. The process provides 1.4 THz Schottky diodes, nichrome resistors, MIM capacitors, and air-bridge inductors. The process does not use any ion implantation. An HBT prescalar circuit designed with this process clocks at 13.5 GHz. A pulser circuit using Schottky diodes demonstrates 8.6 ps risetime.<<ETX>>


european solid state device research conference | 1992

A 45GHz AlGaAs/GaAs HBT IC Technology without Ion-Implantation

S.J. Prasad; B. Vetanen; C. Haynes; S. Park; I. Beers; S. Diamond; G. Pubanz; John Ebner; S. Sanielevici; Agoston Agoston

A 45GHz HBT IC technology with 1.4THz Schottky diodes is described. The process is mesa isolated and implant-free. The process integrates NiCr resistors, MIM capacitors and air-bridge inductors. A divide-by-eight prescaler shows good performance up to 13.5GHz. A pulser circuit using the Schottky diodes produced a voltage pulse with 10.35ps rise time.


[1991] GaAs IC Symposium Technical Digest | 1991

Device testing for the development of an HBT IC process

S. Diamond; S.J. Prasad; John Ebner; G. Pubanz; B. Vetanen; C. Haynes; S. Park; I. Beers

A description is presented of the DC and microwave testing required for the development of an HBT (heterojunction bipolar transistor) integrated circuit process. Process control monitoring structures have been designed to allow device testing at several stages in processing. Wafer mapping of device parameters shows patterns which can help one to understand the process and improve yield. A database has been set up of device parameters. Examining the relation between various transistor parameters has led to experiments to understand the device current gain and has shown some unexpected results.<<ETX>>


Electronics Letters | 1993

First demonstration of 60 GHz-f/sub t/ GaInP/GaAs HBT IC technology with 28 ps ECL gate delay

S.J. Prasad; B. Vetanen; C. Haynes; I. Beers; S. Park


Electronics Letters | 2002

35 GHz f/sub t/ and 26 GHz f/sub max/ GaInP/GaAs heterojunction bipolar transistors

S.J. Prasad; C. Haynes; B. Vetanen; S. Park; I. Beers; D. Davito


european solid state device research conference | 1993

Rapid, On-line Extraction of Base Resistance of HBTs and Correlation with Minimum Noise Figure

S.J. Prasad; J. Laskar


Electronics Letters | 1992

35 GHz ft and 26 GHz fmax GaInP/GaAs heterojunction bipolar transistors

S.J. Prasad; C. Haynes; B. Vetanen; S. Park; I. Beers; D. Davito


european solid state device research conference | 1995

Precise Extraction of Contact Resistivitiy from TLM Structures

S.J. Prasad


european solid state device research conference | 1993

Safe Operating Current Density and Failure modes of Carbon doped base AlGaAs/GaAs HBTs

S.J. Prasad; E. Hultine


MRS Proceedings | 1993

Low Contact Resistivity Mn/Au/Ti/Pd/Au P-Ohmic Contacts for HBTs

B. Vetanen; C. Haynes; S.J. Prasad; I. Beers; S. Park

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