Sebastien Berujon

X-ray wavefront characterization using a rotating shearing interferometer technique

A fast and accurate method to characterize the X-ray wavefront by rotating one of the two gratings of an X-ray shearing interferometer is described and investigated step by step. Such a shearing interferometer consists of a phase grating mounted on a rotation stage, and an absorption grating used as a transmission mask. The mathematical relations for X-ray Moiré fringe analysis when using this device are derived and discussed in the context of the previous literature assumptions. X-ray beam wavefronts without and after X-ray reflective optical elements have been characterized at beamline B16 at Diamond Light Source (DLS) using the presented X-ray rotating shearing interferometer (RSI) technique. It has been demonstrated that this improved method allows accurate calculation of the wavefront radius of curvature and the wavefront distortion, even when one has no previous information on the grating projection pattern period, magnification ratio and the initial grating orientation. As the RSI technique does not require any a priori knowledge of the beam features, it is suitable for routine characterization of wavefronts of a wide range of radii of curvature.

At-wavelength metrology of hard X-ray mirror using near field speckle

We present a method to measure the surface profile of hard X-ray reflective optics with nanometer height accuracy and sub-millimetre lateral resolution. The technique uses X-ray near-field speckle, generated by a scattering membrane translated using a piezo motor, to infer the deflection of X-rays from the surface. The method provides a nano-radian order accuracy on the mirror slopes in both the tangential and sagittal directions. As a demonstration, a pair of focusing mirrors mounted in a Kirkpatrick-Baez (KB) configuration were characterized and the results were in good agreement with offline metrology data. It is hoped that the new technique will provide feedback to optic manufacturers to improve mirror fabrication and be useful for the online optimization of active, nano-focusing mirrors on modern synchrotron beamlines.

Fast optimization of a bimorph mirror using x-ray grating interferometry

An x-ray grating interferometer was employed for in situ optimization of an x-ray bimorph mirror. Unlike many other at-wavelength techniques, only a single interferogram image, captured out of the focal plane, is required, enabling the optical surface to be quickly optimized. Moiré fringe analysis was used to calculate the wavefront slope error, which is proportional to the mirrors slope error. Using feedback from grating interferometry, the slope error of a bimorph mirror was reduced to <200  nrad (rms) in only two iterations. This technique has the potential to create photon beams with spatially homogeneous intensities for use in synchrotron and free electron laser beam lines.

X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer

The application of a two dimensional (2D) grating interferometer-Fresnel zone plate combination for quantitative submicron phase contrast imaging is reported. The combination of the two optical elements allows quick recovery of the phase shift introduced by a sample in a hard X-ray beam, avoiding artifacts observed when using the one dimensional (1D) interferometer for a sample with features oriented in the unsensitive direction of the interferometer. The setup provides submicron resolution due to the optics magnification ratio and a fine sensitivity in both transverse orientations due to the 2D analysis gratings. The method opens up possibilities for sub-micro phase contrast tomography of microscopic objects made of light and/or homogeneous materials with randomly oriented features.

X-ray wavefront characterization of a Fresnel zone plate using a two-dimensional grating interferometer

The x-ray wavefront downstream of a Fresnel zone plate (FZP) was characterized using a two-dimensional grating interferometer. Transverse wavefront slope maps, measured using a raster phase-stepping scan, allowed accurate phase reconstruction of the x-ray beam. Wavefront measurements revealed that the wavefront error is very sensitive to the input beam entering the FZP. A small stack of one-dimensional compound refractive lenses was used to introduce astigmatism in the probing x-ray beam to investigate the contribution of the incoming beam in contrast to the optical aberrations. Experimental data were shown to be consistent with theoretical calculations.

Characterisation of a novel super-polished bimorph mirror

A novel super-polished adaptive bimorph mirror has been developed, which provides variable focal distance and local figure control in the sub-nm range. The optic has the potential to generate distortion-free beams and enable dynamical focusing and wavefront control. We present results of this optic, including ex-situ characterisation of the surface topography using the Diamond-NOM, and in-situ investigation using synchrotron light at Diamonds B16 Test beamline. The wavefront properties of the mirror have also been studied using at-wavelength metrology methods based on X-ray speckle tracking.

X-ray phase contrast tomography by tracking near field speckle

X-ray imaging techniques that capture variations in the x-ray phase can yield higher contrast images with lower x-ray dose than is possible with conventional absorption radiography. However, the extraction of phase information is often more difficult than the extraction of absorption information and requires a more sophisticated experimental arrangement. We here report a method for three-dimensional (3D) X-ray phase contrast computed tomography (CT) which gives quantitative volumetric information on the real part of the refractive index. The method is based on the recently developed X-ray speckle tracking technique in which the displacement of near field speckle is tracked using a digital image correlation algorithm. In addition to differential phase contrast projection images, the method allows the dark-field images to be simultaneously extracted. After reconstruction, compared to conventional absorption CT images, the 3D phase CT images show greatly enhanced contrast. This new imaging method has advantages compared to other X-ray imaging methods in simplicity of experimental arrangement, speed of measurement and relative insensitivity to beam movements. These features make the technique an attractive candidate for material imaging such as in-vivo imaging of biological systems containing soft tissue.

Grating-based at-wavelength metrology of hard x-ray reflective optics

A mean of characterizing the tangential shape of a hard x-ray mirror is presented. Derived from a group of methods operating under visible light, its application in the x-ray domain using an x-ray absorption grating allows recovery of the mirror shape with nanometer accuracy and submillimeter spatial resolution. The method works with incoherent light, does not require any a priori information about the mirror characteristics and allows shape reconstruction of x-ray reflective optics under thermal and mechanical working conditions.

X-ray phase microscopy using the speckle tracking technique

Hard X-ray phase microscopy using the Speckle Tracking technique is presented and the practical implementation of this microscope explained. It is demonstrated that the spatial resolution of the Speckle Tracking technique can be pushed down to the nanometer scale without sacrificing the angular sensitivity, which is in the tens of nanoradians range. Moreover, the method is suitable for the analysis of dynamic samples. Experimental demonstration of the method is given for the case of phase imaging of micrometer size polystyrene spheres using a Fresnel zone plate as a magnifying optical element.

X-ray pulse wavefront metrology using speckle tracking

The theoretical description and experimental implementation of a speckle-tracking-based instrument which permits the characterisation of X-ray pulse wavefronts.