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Hotspot


Dive into the research topics where Shai Silberstein is active.

Publication


Featured researches published by Shai Silberstein.


Archive | 2006

System for detection of wafer defects

Dov Furman; Gad Neumann; Mark Wagner; Noam Dotan; Ram Segal; Shai Silberstein


Archive | 2005

Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images

Yuval Dorphan; Ran Zaslavsky; Mark Wagner; Dov Furman; Shai Silberstein


Archive | 2007

Optical inspection tool featuring multiple speed modes

Giora Eitan; Shai Silberstein


Archive | 2007

Wafer inspection using short-pulsed continuous broadband illumination

Dov Furman; Shai Silberstein


Archive | 2008

Dynamic illumination in optical inspection systems

Shai Silberstein; Tsafrir Avni


Archive | 2007

Image splitting in optical inspection systems

Dov Furman; Roy Kaner; Ori Gonen; Daniel Mandelik; Eran Tal; Shai Silberstein


Archive | 2006

Apparatus for determining optimum position of focus of an imaging system

Dov Furman; Gad Neumann; Mark Wagner; Noam Dotan; Ram Segal; Shai Silberstein


Archive | 2008

Inspection Tools Supporting Multiple Operating States for Multiple Detector Arrangements

Dov Furman; Ehud Tirosh; Shai Silberstein


Archive | 2006

Printed fourier filtering in optical inspection tools

Dan T. Fuchs; Shai Silberstein


Archive | 2003

System for detection of water defects

Dov Furman; Gad Neumann; Mark Wagner; Noam Dotan; Ram Segal; Shai Silberstein

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