Shigeomi Sato
Tohoku University
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Publication
Featured researches published by Shigeomi Sato.
Applied Physics A | 1996
Shigeomi Sato; Kouichi Tsuji; Kichinosuke Hirokawa
A Glancing-Incidence and Take-off X-Ray Fluorescence (GIT-XRF) apparatus with which both incident angle of primary X-ray and take-off angle of fluorescent X-rays can be controlled has been newly developed for characterizing surfaces and interfaces. Using this apparatus, Ni/Mn multilayer samples were evaluated obtaining Take-off-Angle-Dependent X-Ray Fluorescence (TAD-XRF) curves at arbitrary incident angles of primary X-ray. In particular, we could obtain information on the near surface by measuring TAD-XRF curves at the incident angle less than the critical angle of total reflection for primary X-rays.
Archive | 1996
Takanori Akiyoshi; Akiko Sakashita; Yohichi Ishibashi; Tadashi Mochizuki; Shigeomi Sato; Toshiya Maekawa
Archive | 1997
Tadashi Mochizuki; Hitoshi Nagashima; Shigeomi Sato; Yutaka Yoshioka; 重臣 佐藤; 豊 吉岡; 正 望月; 仁 永嶋
Tetsu To Hagane-journal of The Iron and Steel Institute of Japan | 1999
Hitoshi Nagashima; Shigeomi Sato; Mitsuharu Okano; Tadashi Mochizuki; Yutaka Yoshioka; Manabu Tano
Materials Transactions Jim | 1998
Shigeomi Sato; Mitsunori Saito; Eiichiro Matsubara; Yoshio Waseda; Koichiro Inomata
Archive | 1996
Tadashi Mochizuki; Shigeomi Sato; Takanori Akiyoshi; Akiko Sakashita; Yohichi Ishibashi
Tetsu To Hagane-journal of The Iron and Steel Institute of Japan | 1996
Koichi Chiba; Mamoru Yamaji; Takashi Watanabe; Kichinosuke Hirokawa; Akio Akimoto; Atsushi Mori; Yoshihiro Yamamoto; Shigeomi Sato; Osamu Kataoka; Takeshi Numata; Yoshio Oka; Takashi Oishi; Seiji Nakayama; Akihiro Honji; Isao Fukui
Archive | 1996
Tadashi Mochizuki; Shigeomi Sato; Takanori Akiyoshi; Akiko Sakashita; Yohichi Ishibashi
Archive | 1996
Takanori Akiyoshi; Yohichi Ishibashi; Tadashi Mochizuki; Akiko Sakashita; Shigeomi Sato
Archive | 1996
Tadashi Mochizuki; Shigeomi Sato; Takanori Akiyoshi; Akiko Sakashita; Yohichi Ishibashi