Slawomir Winecki

Reliability of measurements of ion fluxes from electron beam ion sources

The pulsed beams of highly charged ions from Electron Beam Ion Sources have certain characteristics which can easily cause incorrect ion flux measurements. This paper discusses the fundamental difficulties as well as the basic tests which can reveal and sometimes identify the problems. The discussion is illustrated with many incorrect as well as correct measurements of the instantaneous and the time-averaged currents of ion beams measured with the KSU CRYEBIS metering system. The summary recommends a number of tests which check all important problems and hence can be used to assure reliable current measurements.

Secondary ion enhancement in slow highly charged heavy ion bombardment

Carbon thin film was bombarded with high charge state Xeq+ ions, and the secondary carbon yields were measured as a function of charge state in the broad range of q = 8 to 44 at the kinetic energy of 1.0 MeV and, also, q = 44 at 175 keV. It is found that the secondary ion yields per incident ion increase with increasing q; the increase rate is remarkably high in q > 26 with the rate of q8.5 and rather moderate in q > 31. The yield and spectra of the secondary ions are not very different for 1.0 MeV and 175 keV for Xeq+ (q = 44) ion incidence.

Production, operation and status of the KSU CRYEBIS facility

The KSU CRYEBIS is a CRY ogenic Electron Beam Ion Source located on a high voltage platform, dedicated to the exploration of the physics of the highly-charged, low-energy ions. This paper summarizes the research accomplished by our users over the last three years. It discusses the experiences encountered in the operation and production over the last three years. The major improvements accomplished over the last three years and the present capabilities are also described. The paper ends with a discussion of the user facility, the available techniques and equipment.