Soren A. Jensen
National Renewable Energy Laboratory
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Featured researches published by Soren A. Jensen.
Journal of Applied Physics | 2016
Soren A. Jensen; Stephen Glynn; Ana Kanevce; P. Dippo; Jian V. Li; D. H. Levi; Darius Kuciauskas
World-record power conversion efficiencies for Cu(In,Ga)Se2 (CIGS) solar cells have been achieved via a post-deposition treatment with alkaline metals, which increases the open-circuit voltage and fill factor. We explore the role of the potassium fluoride (KF) post-deposition treatment in CIGS by employing energy- and time-resolved photoluminescence spectroscopy and electrical characterization combined with numerical modeling. The bulk carrier lifetime is found to increase with post-deposition treatment from 255 ns to 388 ns, which is the longest charge carrier lifetime reported for CIGS, and within ∼40% of the radiative limit. We find evidence that the post-deposition treatment causes a decrease in the electronic potential fluctuations. These potential fluctuations have previously been shown to reduce the open-circuit voltage and the device efficiency in CIGS. Additionally, numerical simulations based on the measured carrier lifetimes and mobilities show a diffusion length of ∼10 μm, which is ∼4 times la...
Journal of Applied Physics | 2017
Ana Kanevce; Matthew O. Reese; Teresa M. Barnes; Soren A. Jensen; Wyatt K. Metzger
CdTe devices have reached efficiencies of 22% due to continuing improvements in bulk material properties, including minority carrier lifetime. Device modeling has helped to guide these device improvements by quantifying the impacts of material properties and different device designs on device performance. One of the barriers to truly predictive device modeling is the interdependence of these material properties. For example, interfaces become more critical as bulk properties, particularly, hole density and carrier lifetime, increase. We present device-modeling analyses that describe the effects of recombination at the interfaces and grain boundaries as lifetime and doping of the CdTe layer change. The doping and lifetime should be priorities for maximizing open-circuit voltage (Voc) and efficiency improvements. However, interface and grain boundary recombination become bottlenecks for device performance at increased lifetime and doping levels. This work quantifies and discusses these emerging challenges f...
Applied Physics Letters | 2016
Soren A. Jensen; James M. Burst; Joel N. Duenow; Harvey Guthrey; John Moseley; Helio Moutinho; Steve Johnston; Ana Kanevce; Mowafak Al-Jassim; Wyatt K. Metzger
For decades, polycrystalline CdTe thin films for solar applications have been restricted to grain sizes of microns or less whereas other semiconductors such as silicon and perovskites have produced devices with grains ranging from less than a micron to more than 1 mm. Because the lifetimes in as-deposited polycrystalline CdTe films are typically limited to less than a few hundred picoseconds, a CdCl2 treatment is generally used to improve the lifetime; but this treatment may limit the achievable hole density by compensation. Here, we establish methods to produce CdTe films with grain sizes ranging from hundreds of nanometers to several hundred microns by close-spaced sublimation at industrial manufacturing growth rates. Two-photon excitation photoluminescence spectroscopy shows a positive correlation of lifetime with grain size. Large-grain, as-deposited CdTe exhibits lifetimes exceeding 10 ns without Cl, S, O, or Cu. This uncompensated material allows dopants such as P to achieve a hole density of 1016 c...
IEEE Journal of Photovoltaics | 2016
Joel N. Duenow; James M. Burst; David S. Albin; Matthew O. Reese; Soren A. Jensen; Steven W. Johnston; Darius Kuciauskas; Santosh K. Swain; Tursun Ablekim; Kelvin G. Lynn; Alan L. Fahrenbruch; Wyatt K. Metzger
We investigate the correlation of bulk CdTe and CdZnTe material properties with experimental open-circuit voltage (Voc) through fabrication and characterization of diverse single-crystal solar cells with different dopants. Several distinct crystal types reach Voc > 900 mV. Correlations are in general agreement with Voc limits modeled from bulk minority-carrier lifetime and hole concentration.
Scientific Reports | 2017
Soren A. Jensen; Ana Kanevce; Lorelle M. Mansfield; Stephen Glynn; Stephan Lany; Darius Kuciauskas
Cu(In,Ga)Se2 (CIGS) is presently the most efficient thin-film photovoltaic technology with efficiencies exceeding 22%. An important factor impacting the efficiency is metastability, where material changes occur over timescales of up to weeks during light exposure. A previously proposed (VSe-VCu) divacancy model presents a widely accepted explanation. We present experimental evidence for the optically induced metastability transition and expand the divacancy model with first-principles calculations. Using photoluminescence excitation spectroscopy, we identify a sub-bandgap optical transition that severely deteriorates the carrier lifetime. This is in accordance with the expanded divacancy model, which predicts that states below the conduction band are responsible for the metastability change. We determine the density–capture cross-section product of the induced lifetime-limiting states and evaluate their impact on device performance. The experimental and theoretical findings presented can allow assessment of metastability characteristics of leading thin-film photovoltaic technologies.
Applied Physics Letters | 2017
Darius Kuciauskas; Thomas H. Myers; Teresa M. Barnes; Soren A. Jensen; Alyssa M. Allende Motz
From time- and spatially resolved optical measurements, we show that extended defects can have a large effect on the charge-carrier recombination in II–VI semiconductors. In CdTe double heterostructures grown by molecular beam epitaxy on the InSb (100)-orientation substrates, we characterized the extended defects and found that near stacking faults the space-charge field extends by 2–5 μm. Charge carriers drift (with the space-charge field strength of 730–1,360 V cm−1) and diffuse (with the mobility of 260 ± 30 cm2 V−1 s−1) toward the extended defects, where the minority-carrier lifetime is reduced from 560 ns to 0.25 ns. Therefore, the extended defects are nonradiative recombination sinks that affect areas significantly larger than the typical crystalline grains in II–VI solar cells. From the correlative time-resolved photoluminescence and second-harmonic generation microscopy data, we developed a band-diagram model that can be used to analyze the impact of extended defects on solar cells and other elect...
photovoltaic specialists conference | 2016
Ingrid Repins; Lorelle M. Mansfield; Ana Kanevce; Soren A. Jensen; Darius Kuciauskas; Stephen Glynn; Teresa M. Barnes; Wyatt K. Metzger; James M. Burst; Chun-Sheng Jiang; P. Dippo; Steve Harvey; Glenn Teeter; Craig L. Perkins; Brian Egaas; Andriy Zakutayev; Jan-Hendrik Alsmeier; Thomas Lusky; Lars Korte; Regan G. Wilks; M. Bär; Yanfa Yan; Stephan Lany; Pawel Zawadzki; Ji-Sang Park; Su-Huai Wei
Band-edge effects - including grading, electrostatic fluctuations, bandgap fluctuations, and band tails - affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In, Ga)Se2 devices, recent increases in diffusion length imply changes to the optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu2SnS3, CuSbS2), considering differences in materials properties, is examined.
IEEE Journal of Photovoltaics | 2016
Darius Kuciauskas; Keith A. Wernsing; Soren A. Jensen; Teresa M. Barnes; Thomas H. Myers; Randy A. Bartels
We used time-resolved photoluminescence micro-scopy to analyze charge carrier transport and recombination in CdTe double heterostructures fabricated by molecular beam epitaxy (MBE). This allowed us to determine the charge carrier mobility in this system, which was found to be 500-625 cm2/(V·s). Charge carrier lifetimes in the 15-100 ns range are limited by the interface recombination, and the data indicate higher interface recombination velocity near extended defects. This study describes a new method to analyze the spatial distribution of the interface recombination velocity and the interface defects in semiconductor heterostructures.
Scientific Reports | 2018
Brian E. McCandless; Wayne A. Buchanan; Christopher P. Thompson; Gowri Sriramagiri; Robert J. Lovelett; Joel N. Duenow; David S. Albin; Soren A. Jensen; Eric Colegrove; John Moseley; Helio Moutinho; Steve Harvey; Mowafak Al-Jassim; Wyatt K. Metzger
Thin film materials for photovoltaics such as cadmium telluride (CdTe), copper-indium diselenide-based chalcopyrites (CIGS), and lead iodide-based perovskites offer the potential of lower solar module capital costs and improved performance to microcrystalline silicon. However, for decades understanding and controlling hole and electron concentration in these polycrystalline films has been extremely challenging and limiting. Ionic bonding between constituent atoms often leads to tenacious intrinsic compensating defect chemistries that are difficult to control. Device modeling indicates that increasing CdTe hole density while retaining carrier lifetimes of several nanoseconds can increase solar cell efficiency to 25%. This paper describes in-situ Sb, As, and P doping and post-growth annealing that increases hole density from historic 1014 limits to 1016–1017 cm−3 levels without compromising lifetime in thin polycrystalline CdTe films, which opens paths to advance solar performance and achieve costs below conventional electricity sources.
photovoltaic specialists conference | 2016
Soren A. Jensen; P. Dippo; Lorelle M. Mansfield; Stephen Glynn; Darius Kuciauskas
We use two-wavelength excitation photoluminescence spectroscopy to probe defect states in CIGS thin films. Above-Eg excitation is combined with a tunable IR bias light that modulates the population of the defect states. We find that IR illumination in the range of 1400-2000 nm (0.62-0.89 eV) causes a reduction of the PL intensity, the magnitude of which scales linearly with IR power. Further, KF post deposition treatment has only a modest influence on the effect of the IR excitation. Initial data suggest that we have developed an optical characterization tool for band-gap defect states.