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Dive into the research topics where Stefan Frehse is active.

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Featured researches published by Stefan Frehse.


reversible computation | 2011

RevKit: an open source toolkit for the design of reversible circuits

Mathias Soeken; Stefan Frehse; Robert Wille; Rolf Drechsler

In recent years, research in the domain of reversible circuit design has attracted significant attention leading to many different approaches e.g. for synthesis, optimization, simulation, verification, and test. The open source toolkit RevKit is an attempt to make these developments publicly available to other researchers. For this purpose, a modular and extendable framework has been provided which easily enables the addition of new methods and tools. In this paper, we introduce the functionality as well as the internals of RevKit. We provide examples and use cases showing how to apply RevKit and its components in order to create and execute customized design flows. Furthermore, we demonstrate how the architecture and the design concepts of RevKit can be exploited to easily develop new or improved methods for reversible circuit design.


design, automation, and test in europe | 2009

Debugging of Toffoli networks

Robert Wille; Daniel Grosse; Stefan Frehse; Gerhard W. Dueck; Rolf Drechsler

Intensive research is performed to find post-CMOS technologies. A very promising direction based on reversible logic are quantum computers. While in the domain of reversible logic synthesis, testing, and verification have been investigated, debugging of reversible circuits has not yet been considered. The goal of debugging is to determine gates of an erroneous circuit that explain the observed incorrect behavior. In this paper we propose the first approach for automatic debugging of reversible Toffoli networks. Our method uses a formulation for the debugging problem based on Boolean satisfiability. We show the differences to classical (irreversible) debugging and present theoretical results. These are used to speed-up the debugging approach as well as to improve the resulting quality. Our method is able to find and to correct single errors automatically.


IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2011

Effective Robustness Analysis Using Bounded Model Checking Techniques

Görschwin Fey; André Sülflow; Stefan Frehse; Rolf Drechsler

Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g., due to environmental radiation. Approaches to implement fault tolerance are known. But assessing the fault tolerance of a given implementation is a hard verification problem. Here, we propose the use of formal methods to assess the robustness of a digital circuit with respect to transient faults. Our formal model uses a fixed bound in time and exploits fault detection circuitry to cope with the complexity of the underlying sequential equivalence check. As a result, a lower and an upper bound on the robustness are returned together with vulnerable components. The underlying algorithm and techniques to improve the efficiency are presented. In experiments, we evaluate the method on circuits with different fault detection mechanisms.


great lakes symposium on vlsi | 2010

Enhancing debugging of multiple missing control errors in reversible logic

Jean Christoph Jung; Stefan Frehse; Robert Wille; Rolf Drechsler

Researchers are looking for alternatives to overcome the upcoming limits of conventional hardware technologies. Reversible logic thereby established itself as a promising direction so that several methods for synthesis, verification, and testing of reversible circuits have already been proposed. However, also methods for debugging, i.e., to determine error candidates in case of a failed verification, are required to complete the design flow. Even if first approaches have already been proposed, debugging of reversible circuits still is in the beginning. In this paper, we present an alternative method to automatically debug reversible circuits. We thereby focus on missing control errors -- an established error model in the design of reversible circuits. A new notion of an error candidate is proposed that relies on the observation of a necessary condition for error locations in reversible circuits. Using this notion, a set of error candidates is obtained that differs from the error candidates returned by previous methods. Thus, combining the approaches enhances the overall debugging flow. Experimental results demonstrate that a higher accuracy is obtained in significantly shorter run-time.


digital systems design | 2009

Robustness Check for Multiple Faults Using Formal Techniques

Stefan Frehse; Görschwin Fey; André Suflow; Rolf Drechsler

Feature sizes in VLSI circuits are steadily shrinking. This results in increasing susceptibility to soft errors, e.g. due to environmental radiation. Precautions against soft errors can be taken on all design stages, e.g. the architectural level, algorithmic level, or on the layout level. Whether the final implementation contains flaws or really provides robustness to soft errors remains to be checked. Here, we propose an approach to formally verify the robustness of a circuit with respect to multiple soft errors. We propose a fault model that prunes the exponentially sized space of multiple soft errors and an algorithm that automatically analyzes a given circuit.


Integration | 2011

Debugging reversible circuits

Robert Wille; Daniel Groíe; Stefan Frehse; Gerhard W. Dueck; Rolf Drechsler

A strong driving force for research of post-CMOS technologies is the fact that silicon-based transistors cannot be arbitrarily scaled down. Furthermore, power dissipation is a major barrier in the development of smaller and more efficient computer chips. In contrast, reversible logic with its applications e.g. in low-power design or quantum computation provides a promising alternative to traditional technologies. While there have been investigations in the domain of reversible logic synthesis, testing, and verification; debugging of reversible circuits has not yet been considered. The goal of debugging is to determine gates of an erroneous circuit that explain the observed incorrect behavior. In this paper, we propose the first approach for automatic debugging of reversible Toffoli circuits. Our method uses a formulation for the debugging problem based on Boolean satisfiability. We show the differences to traditional (irreversible) debugging. In addition, we introduce an improved approach that strengthens error candidate identification. This overcomes the limitations from traditional debugging, i.e. that error candidates are only an approximation of the real source of the error. Furthermore, observations are presented that can be applied to automatically fix an erroneous circuit just by replacing a single gate by a cascade. Due to reversibility this cascade can be efficiently computed. Experimental results show the quality and efficiency of our debugging approaches.


international symposium on multiple-valued logic | 2010

Efficient Simulation-Based Debugging of Reversible Logic

Stefan Frehse; Robert Wille; Rolf Drechsler

Reversible logic has become an active research area due to its various applications in emerging technologies, like quantum computing, low power design, optical computing, DNA computing, or nanotechnologies. As a result, complex reversible circuits containing thousands of gates can be efficiently synthesized, today. However, this also increases the probability of design errors. While for the detection of errors already a couple of simulation-based or formal verification techniques have been proposed for reversible logic. Research in the domain of debugging is still at the beginning. In this paper, we present an automatic debugging approach for reversible logic which is based on simulation. We show that a particular error in a gate always requires a counterexample leading to a concrete gate input pattern. By simulating all counterexamples and checking for these input patterns, irrelevant gates (i.e. gates that do not contain an error) can be excluded. Experiments show, that applying the proposed approach leads to speed-ups of up to five orders of magnitude. Furthermore, the number of error candidates can be reduced in comparison to previous work.


design, automation, and test in europe | 2013

Improving fault tolerance utilizing hardware-software-co-synthesis

Heinz Riener; Stefan Frehse; Görschwin Fey

Embedded systems consist of hardware and software and are ubiquitous in safety-critical and mission-critical fields. The increasing integration density of modern, digital circuits causes an increasing vulnerability of embedded systems to transient faults. Techniques to improve the fault tolerance are often either implemented in hardware or in software. In this paper, we focus on synthesis techniques to improve the fault tolerance of embedded systems considering hardware and software. A greedy algorithm is presented which iteratively assesses the fault tolerance of a processor-based system and decides which components of the system have to be hardened choosing from a set of existing techniques. We evaluate the algorithm in a simple case study using a Traffic Collision Avoidance System (TCAS).


africon | 2011

Determining minimal testsets for reversible circuits using Boolean satisfiability

Hongyan Zhang; Stefan Frehse; Robert Wille; Rolf Drechsler

Reversible circuits are an attractive computation model as they theoretically enable computations with close to zero power consumption. Furthermore, reversible circuits found significant attention in the domain of quantum computation. With the emergence of first physical realizations for this kind of circuits, also testing issues become of interest. Accordingly, first approaches for automatic test pattern generation have been introduced. However, they suffer either from their limited scalability or do not generate a minimal testset. In this paper, a SAT-based algorithm for the determination of minimal complete testsets is proposed. An experimental evaluation of the proposed method shows that the algorithm is applicable to reversible circuits with more than 2 000 gates.


Proceedings of the First Workshop on DYnamic Aspects in DEpendability Models for Fault-Tolerant Systems | 2010

RobuCheck: a robustness checker for digital circuits

Stefan Frehse; Görschwin Fey; André Sülflow; Rolf Drechsler

Continuously shrinking feature sizes lead to an increasing vulnerability of digital circuits. Transient faults may tamper the functionality. Design automation is required to analyze whether faults may induce erroneous output of a circuit. In this paper, the design tool RobuCheck is presented to analyze the influence of transient faults on a circuits behavior. As a result, the tool identifies components that require protection to obtain fault tolerance. Furthermore, an overall robustness estimation of the circuit is determined.Continuously shrinking feature sizes lead to an increasing vulnerability of digital circuits. Transient faults may tamper the functionality. Design automation is required to analyze whether faults may induce erroneous output of a circuit. In this paper, the design tool RobuCheck is presented to analyze the influence of transient faults on a circuits behavior. As a result, the tool identifies components that require protection to obtain fault tolerance. Furthermore, an overall robustness estimation of the circuit is determined.

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Robert Wille

Johannes Kepler University of Linz

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Heinz Riener

German Aerospace Center

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Mathias Soeken

École Polytechnique Fédérale de Lausanne

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Gerhard W. Dueck

University of New Brunswick

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