Steven L. Hamren

Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices

Method for processing and/or shipping integrated circuit devices

Method and apparatus for processing semiconductor devices in a singulated form

Conductive bump array contactors having an ejector and methods of testing using same

Methods for processing semiconductor devices in a singulated form

Carrier, method and system for handling semiconductor components

Apparatus for processing semiconductor devices in a singulated form

Compliant contactor for testing semiconductors

Imaging test socket, system, and method of testing an image sensor device

Electronic component assemblies with electrically conductive bonds