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Daniel P. Cram

Micron Technology

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Publication

Featured researches published by Daniel P. Cram.

Archive | 2001

Integrated circuit package alignment feature

David J. Corisis; Tracy V. Reynolds; Michael Slaughter; Daniel P. Cram; Leland R. Nevill; Jerrold L. King

Archive | 1999

Integrated circuit package including lead frame with electrically isolated alignment feature

David J. Corisis; Tracy V. Reynolds; Michael Slaughter; Daniel P. Cram; Leland R. Nevill; Jerrold L. King

Archive | 2003

Method and system for wafer level testing and burning-in semiconductor components

Daniel P. Cram

Archive | 2002

Conductive polymer contact system and test method for semiconductor components

Daniel P. Cram

Archive | 2005

Test method for semiconductor components using anisotropic conductive polymer contact system

Daniel P. Cram

Archive | 2004

Method and apparatus for processing semiconductor devices in a singulated form

Steven L. Hamren; Daniel P. Cram

Archive | 2004

Test system and test contactor for electronic modules having beam spring contacts

Daniel P. Cram

Archive | 2006

Resilient contact probe apparatus

Daniel P. Cram; Scott L. Hoagland

Archive | 2005

Test system and test contactor for electronic modules

Daniel P. Cram

Archive | 2004

Test system for electronic modules having contactors with spring segment terminal portions

Daniel P. Cram

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Collaboration

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A. Jay Stutzman

Micron Technology

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Scott L. Hoagland

Micron Technology

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Steven L. Hamren

Micron Technology

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Amos Jay Stutzman

Micron Technology

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David J. Corisis

Micron Technology

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Jerrold L. King

Micron Technology

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Kyle K. Kirby

Micron Technology

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Leland R. Nevill

Micron Technology

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Michael Slaughter

Micron Technology

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Roy T. Lange

Micron Technology

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