Sumie Morita
Fujitsu
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Sumie Morita.
international symposium on software reliability engineering | 2015
Kiyoshi Honda; Hironori Washizaki; Yoshiaki Fukazawa; Kazuki Munakata; Sumie Morita; Tadahiro Uehara; Rieko Yamamoto
In software development, software reliability growth models (SRGMs) often provide values that do not meet expectations; sometimes the results of the SRGM and the actual data disagree and other times the SRGM overestimates the expected values. The former often occurs in model curves and the predicted number of faults. For example, the software reliability growth curve cannot describe the situation where developers stop testing multiple times because the equations in SRGMs cannot treat such information. The latter can arise when the total number of expected faults is 100, but the SRGM indicates 1000. If developers encounter such situations, they often doubt the SRGM results and hesitate using SRGMs for predictions. In this study, we apply two different cases of SRGM. Two projects of Fujitsu Labs Ltd. are analyzed using SRGM either for the entire dataset or each test phase. Based on the results and interviews with the developers, we found that the model using separate test phases provides a better fit because faults counted in each test phase have different viewpoints and the deviation between SRGM and expectations indicates a problem with development.
2017 8th International Workshop on Empirical Software Engineering in Practice (IWESEP) | 2017
Jieming Chi; Kiyoshi Honda; Hironori Washizaki; Yoshiaki Fukazawa; Kazuki Munakata; Sumie Morita; Tadahiro Uehara; Rieko Yamamoto
In software development, defects are inevitable. To improve reliability, software reliability growth models are useful to analyze projects. Selecting an expedient model can also help with defect predictions, but the model must be well fitted to all the original data. A particular software reliability growth model may not fit all the data well. To overcome this issue, herein we use multistage modeling to fit defect data. In the multistage model, an evaluation is used to divide the data into several parts. Each part is fitted with its own growth model, and the separate models are recombined. As a case study, projects provided by a Japanese enterprise are analyzed by both traditional software reliability growth models and the multistage model. The multistage model has a better performance for data with a poor fit using a traditional software reliability growth model.
Archive | 1995
Yoshihiro Watanabe; Satoshi Kakuma; Sumie Morita; Yuzo Okuyama; Kenichi Okabe
Archive | 1995
Ryouzi Takano; Masataka Sakai; Sumie Morita; Kiyohumi Mitsuze; Yoshiharu Kato
Archive | 1993
Sumie Morita; Takashi Hatano; Ryouzi Takano; Hisashi Koga; Tsutomu Shiomitsu
Archive | 1997
Sumie Morita; Kiyohumi Mitsuze; Ryouzi Takano; Kenichi Okabe; Katsuaki Akama
Archive | 1996
Yoshihiro Watanabe; Hiroshi Nishida; Sumie Morita; Kenichi Okabe
Archive | 1998
Eiji Ishioka; Sumie Morita; Shigeru Sekine; Hiromi Odaka; Yoshihiro Watanabe; Toshiaki Oishi
Archive | 1991
Ryouzi Takano; Kiyohumi Mitsuze; Takashi Nara; Takashi Hatano; Sumie Morita
Archive | 1999
Hiromi Odaka; Sumie Morita; Shigeru Sekine; Eiji Ishioka; Hisashi Koga