Sung-hoon Cho

A 32nm high-k metal gate application processor with GHz multi-core CPU

Samsungs next-generation 32nm dual/quad-core Exynos™ processor integrates 2 or 4 ARM-v7A architecture cores, a 2-port DRAM controller and numerous multimedia accelerators and connectivity blocks on the same die. It is an application processor (AP) designed to cover a wide variety of mobile applications and handle unprecedented data-processing throughput and multimedia performance, without sacrificing the battery life or exceeding the thermal power dissipation envelope. The architecture diagram is shown in Fig. 12.1.1 and the die photo for the quad-core configuration is shown in Fig. 12.1.7.

Heterodyne double-channel polarimeter for mapping birefringence and thickness of flat glass panels

A new cross-polarized heterodyne optical technique is developed for two-dimensional (2D) simultaneous mapping of both birefringence and thickness variations in large flat glass panels commonly used in liquid-crystal displays (LCDs). Weak depolarization of a linearly polarized probe beam due to glass birefringence is detected by means of heterodyne mixing of the two cross-polarized and frequency shifted waves generated by Zeeman-type laser. Amplitude variations of the transmitted laser beam due to interference of the partial waves reflected from the both sides of a sample provide information about glass thickness. Measurements are being performed at the intermediate frequency of 2.3MHz, providing several orders of magnitude higher speed of data acquisition with respect to traditional polarimeters. That high speed of measurements makes it possible to perform quality assessment of LCD glass panels not only in few randomly chosen points as it was in common practice before but to obtain entire 2D maps of both ...

Differential heterodyne interferometer for measuring thickness of glass panels

Differential heterodyne interferometer is applied for measuring spatial thickness variations across glass panels of liquid-crystal displays. This system uses the Zeeman laser as a source of two-frequency shifted orthogonally linearly polarized probe waves, passing through the glass in two spatially separated points. These waves are then recombined in a single beam to produce the intermediate frequency signal with the phase proportional to the thickness gradient of a glass sample. The phase of the intermediate signal is measured against the laser reference by means of a lock-in amplifier, and finally real-time integration provides the thickness variation. Since spatial separation of the probe beams is only 1.35 mm good approximation for the thickness gradient is achieved. Detailed design of the interferometer and experimental results on real samples are presented.

Scanning heterodyne Kerr-effect microscope for imaging of magnetic tracks

Design and performance of a new type of Kerr microscope based on heterodyne cross-polarized technique is presented. Weak depolarization of the probe beam due to longitudinal magneto-optical Kerr effect is detected by means of heterodyne mixing of the two cross-polarized and frequency shifted waves generated by Zeeman-type He–Ne laser. In comparison with the traditional homodyne method the proposed technique has better sensitivity and spatial resolution. Experimental results of imaging service magnetic tracks on real samples of magnetic disks are presented, showing better contrast and spatial resolution with respect to the images obtained from commercial devices available in the market.