Sung-Joo Park

Semiconductor memory device, memory device support and memory module

MODULE HAVING TEST ARCHITECTURE FOR FACILITATING THE TESTING OF BALL GRID ARRAY PACKAGES, AND TEST METHOD USING THE SAME

MEMORY MODULE, MEMORY MODULE SOCKET AND MAINBOARD USING SAME

THERMAL-EMITTING MEMORY MODULE, THERMAL-EMITTING MODULE SOCKET, AND COMPUTER SYSTEM

Mounting structures for integrated circuit modules

DATA RECEIVER, SEMICONDUCTOR DEVICE AND MEMORY DEVICE INCLUDING THE SAME

Memory module and register with minimized routing path

Memory system with improved signal integrity

SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR MEMORY SYSTEM FOR COMPENSATING CROSSTALK

Memory module having improved arrangement of discrete devices