T. van Oudheusden
Eindhoven University of Technology
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Publication
Featured researches published by T. van Oudheusden.
Physical Review Letters | 2010
T. van Oudheusden; P.L.E.M. Pasmans; S.B. van der Geer; M.J. de Loos; M. J. van der Wiel; O. J. Luiten
We demonstrate the compression of 95 keV, space-charge-dominated electron bunches to sub-100 fs durations. These bunches have sufficient charge (200 fC) and are of sufficient quality to capture a diffraction pattern with a single shot, which we demonstrate by a diffraction experiment on a polycrystalline gold foil. Compression is realized by means of velocity bunching by inverting the positive space-charge-induced velocity chirp. This inversion is induced by the oscillatory longitudinal electric field of a 3 GHz radio-frequency cavity. The arrival time jitter is measured to be 80 fs.
Journal of Applied Physics | 2007
T. van Oudheusden; E.F. de Jong; S. B. van der Geer; W.P.E.M. op 't Root; O. J. Luiten; Bradley J. Siwick
We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical estimates and state-of-the-art particle tracking simulations show that it is possible to create 100 keV, 0.1 pC, 30 fs electron bunches with a spot size smaller than 500 μm and a transverse coherence length of 3 nm, using established technologies in a table-top setup. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing a single-shot, ultrafast electron diffraction source concept.
Journal of Vacuum Science and Technology | 2009
T. van Oudheusden; J.R. Nohlmans; W. S. C. Roelofs; W.P.E.M. op 't Root; O. J. Luiten
We have designed and built a 3 GHz radio-frequency cavity for use as an ultrafast streak camera to measure with 10 fs resolution the duration of electron bunches that are suitable for single-shot ultrafast electron diffraction experiments. We present our first measurements of 10 ps electron bunches and explain how we will measure sub-100 fs bunch durations.
Chemical Communications | 2010
P.L.E.M. Pasmans; T. van Oudheusden; M.J. de Loos; S.B. van der Geer; A.J.C. Klessens; O. J. Luiten
High-quality electron diffraction patterns can be recorded in a single sub-picosecond shot by using radio-frequency compression techniques to overcome the Coulomb expansion of the required electron bunches. First single-shot diffraction measurements are presented.
Physical Review Special Topics-accelerators and Beams | 2006
S.B. van der Geer; M.J. de Loos; T. van Oudheusden; W.P.E.M. op 't Root; M. J. van der Wiel; O. J. Luiten
Physical Review Special Topics-accelerators and Beams | 2007
W.P.E.M. op 't Root; P. W. Smorenburg; T. van Oudheusden; M. J. van der Wiel; O.J. Luiten
Applied Optics | 2011
E.J.D. Vredenbregt; N. Debernardi; W.J. Engelen; T. van Oudheusden; P.L.E.M. Pasmans; A. Lassise; S.B. van der Geer; P.H.A. Mutsaers; O.J. Luiten
Archive | 2009
M.J. de Loos; S.B. van der Geer; T. van Oudheusden; O.J. Luiten
Microscopy and Microanalysis | 2008
J Luiten; T. van Oudheusden; Bradley J. Siwick; E De Jong; W.P.E.M. op 't Root; B Van der Geer
Journal of the Acoustical Society of America | 2007
T. van Oudheusden; E.F. de Jong; J.R. Nohlmans; W.P.E.M. op 't Root; S.B. van der Geer; M. J. van der Wiel; O.J. Luiten