Takashi Fushie
Hoya Corporation
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Publication
Featured researches published by Takashi Fushie.
Journal of Nuclear Science and Technology | 2014
Yuki Mitsuya; Takeshi Fujiwara; Hiroyuki Takahashi; Takashi Fushie
The gas electron multiplier (GEM) is a gaseous detector that is widely used in many applications. Our glass GEM (G-GEM) comprises a photo-etchable glass (PEG3, HOYA Corporation, Japan). Our research indicated that it shows superior performance compared with other gas detectors. In this article, a new type of G-GEM is introduced. It has a guard-ring structure around the holes in order to improve the spark tolerance by reducing the total capacitance of each hole structure. A measured gas gain of approximately 7500 is attained for this new G-GEM with a single-sided guard-ring structure using a gas mixture of Ar (90%) and CH4 (10%) in the gas flow mode. An energy resolution of 17.3% (FWHM) is also achieved with a collimated 6 keV X-ray beam. The results of a 10 to 12 hour gas gain stability measurements are also shown.
Archive | 2000
Takashi Fushie; Takeshi Kagatsume; Shigekazu Matsui
Archive | 2006
Takashi Fushie; Takeshi Kagatsume; Shigekazu Matsui
Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment | 2013
Hiroyuki Takahashi; Yuki Mitsuya; Takeshi Fujiwara; Takashi Fushie
Archive | 2006
Takashi Fushie; Norimichi Annaka; Takeshi Kagatsume
Archive | 2004
Takashi Fushie; Norimichi Annaka; Takeshi Kagatsume
Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment | 2015
Yuki Mitsuya; Takeshi Fujiwara; Takashi Fushie; Tatsuyuki Maekawa; Hiroyuki Takahashi
Journal of Instrumentation | 2014
Takeshi Fujiwara; Yuki Mitsuya; Hiroyuki Takahashi; Takashi Fushie; S. Kishimito; B. Guèrard; Mitsuru Uesaka
Archive | 2011
Takashi Fushie; Hajime Kikuchi
Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment | 2013
Fuyuki Tokanai; Toru Moriya; Mirei Takeyama; Hirohisa Sakurai; Shuichi Gunji; Takashi Fushie; Hajime Kikuchi; Takayuki Sumiyoshi; H. Sugiyama; Teruyuki Okada; Noboru Ohishi; S. Kishimoto; Hideki Hamagaki
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National Institute of Advanced Industrial Science and Technology
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