Takayasu Sakurai

Cluster formation of Li on the Si(111)7×7 surface

Using a field ion‐scanning tunneling microscope (FI‐STM), the adsorption process of Li on the Si(111)7×7 surface has been studied. At the initial stage, trimers are formed preferentially in the faulted half of the 7×7 unit cell. At higher coverages, these trimers coalesce to form six‐atom and nine‐atom clusters across the interface between the faulted and unfaulted halves. It is suggested, based on the careful study of the adsorption sites, that the Si adatoms of the dimer–adatom‐stacking fault (DAS) model may be removed upon the Li adsorption.

Functional Probes for Scanning Probe Microscopy

Functional probes for scanning probe microscopy (SPM) were fabricated with focused ion beam (FIB) method. Metal-tip cantilevers were fabricated for Kelvin probe force microscopy (KFM) and glass-coated tungsten tips were fabricated for scanning tunneling microscopy under irradiation of synchrotron-radiation light (SR-STM). Here we report the fabrication process and the characterization of those functional probes.