Toyoaki Eguchi

Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators

The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most atomic force microscopes use micromachined force sensors made from silicon, but piezoelectric quartz sensors are being applied at an increasing rate, mainly in vacuum. These self-sensing force sensors allow a relatively easy upgrade of a scanning tunneling microscope to a combined scanning tunneling/atomic force microscope. Two fundamentally different types of quartz sensors have achieved atomic resolution: the “needle sensor,” which is based on a length-extensional resonator, and the “qPlus sensor,” which is based on a tuning fork. Here, we calculate and measure the noise characteristics of these sensors. We find four noise sources: deflection detector noise, thermal noise, oscillator noise, and thermal drift noise. We calculate the effect of these noise sources as a factor of sensor stiffness, bandwidth, and oscillation amplitude. We find that for self-sensing quartz sensors, the deflection detector noise is independent of sensor stiffness, while the remaining three noise sources increase strongly with sensor stiffness. Deflection detector noise increases with bandwidth to the power of 1.5, while thermal noise and oscillator noise are proportional to the square root of the bandwidth. Thermal drift noise, however, is inversely proportional to bandwidth. The first three noise sources are inversely proportional to amplitude while thermal drift noise is independent of the amplitude. Thus, we show that the earlier finding that quoted an optimal signal-to-noise ratio for oscillation amplitudes similar to the range of the forces is still correct when considering all four frequency noise contributions. Finally, we suggest how the signal-to-noise ratio of the sensors can be improved further, we briefly discuss the challenges of mounting tips, and we compare the noise performance of self-sensing quartz sensors and optically detected Si cantilevers.

Cu-TBPP and PTCDA molecules on insulating surfaces studied by ultra-high-vacuum non-contact AFM

The adsorption of two kinds of porphyrin (Cu-TBPP) and perylene (PTCDA) derived organic molecules deposited on KBr and Al2O3 surfaces has been studied by non-contact force microscopy in ultra-high vacuum, our goal being the assembly of ordered molecular arrangements on insulating surfaces at room temperature. On a Cu(100) surface, well ordered islands of Cu-TBPP molecules were successfully imaged. On KBr and Al2O3 surfaces, it was found that the same molecules aggregate in small clusters at step edges, rather than forming ordered monolayers. First measurements with PTCDA on KBr show that nanometre-scale rectangular pits in the surface can act as traps to confine small molecular assemblies.

Development of a metal–tip cantilever for noncontact atomic force microscopy

We report on a focused-ion-beam fabrication of a metal–tip cantilever for noncontact atomic force microscopy (AFM) and demonstrate its superior performance by observing atomically resolved AFM images of the Si(111)7×7 surface. Characterization of the tip apex by transmission electron microscope revealed that the tip radius is less than 5nm. Detrimental changes in the resonance frequency and the Q factor of the cantilever due to the attachment of the metal tip are small and do not affect the performance of the AFM imaging. Since the fabrication technique is applicable to any materials, various functional probes can be developed with this method.

Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator

Using a 1MHz length-extension type of quartz resonator as a force sensor for frequency-modulation atomic force microscopy (AFM), atomically resolved images of the Si(111)-(7×7) surface was obtained. Fabrications of a tip attached at the front end of the resonator by focused ion beam, and removal of the native oxide layer on the tip by in-situ field ion microscopy are found effective for achieving the highly-resolved AFM imaging.

Element specific imaging by scanning tunneling microscopy combined with synchrotron radiation light

Microscopic surface images showing a distribution of a designated element was obtained by scanning tunneling microscopy combined with synchrotron radiation light. A tip current induced by photoirradiation is found to increase when the photon energy is just above the absorption edge of a sample element. From the photoinduced current measured during the tip scanning over the surface, element specific images were obtained. An estimated spatial resolution of the chemical imaging is less than 20nm, better than that achieved by photoemission electron microscopy.

Molecular-Scale and Wide-Energy-Range Tunneling Spectroscopy on Self-Assembled Monolayers of Alkanethiol Molecules

The electronic properties of alkanethiol self-assembled monolayers (alkanethiolate SAMs) associated with their molecular-scale geometry are investigated using scanning tunneling microscopy and spectroscopy (STM/STS). We have selectively formed the three types of alkanethiolate SAMs with standing-up, lying-down, and lattice-gas phases by precise thermal annealing of the SAMs which are conventionally prepared by depositing alkanethiol molecules onto Au(111) surface in solution. The empty and filled states of each SAM are evaluated over a wide energy range covering 6 eV above/below the Fermi level (E(F)) using two types of STS on the basis of tunneling current-voltage and distance-voltage measurements. Electronic states originating from rigid covalent bonds between the thiol group and substrate surface are observed near E(F) in the standing-up and lying-down phases but not in the lattice-gas phase. These states contribute to electrical conduction in the tunneling junction at a low bias voltage. At a higher energy, a highly conductive state stemming from the alkyl chain and an image potential state (IPS) formed in a vacuum gap appear in all phases. The IPS shifts toward a higher energy through the change in the geometry of the SAM from the standing-up phase to the lattice-gas phase through the lying-down phase. This is explained by the increasing work function of alkanethiolate/Au(111) with decreasing density of surface molecules.

Development and trial measurement of synchrotron-radiation-light- illuminated scanning tunneling microscope

Scanning tunneling microscope (STM) study is performed under synchrotron-radiation-light illumination. The equipment is designed so as to achieve atomic resolution even under rather noisy conditions in the synchrotron radiation facility. By measuring photoexcited electron current by the STM tip together with the conventional STM tunneling current, Si 2p soft-x-ray absorption spectra are successfully obtained from a small area of Si(111) surface. The results are a first step toward realizing a new element-specific microscope.

Superconductivity of nanometer-size Pb islands studied by low-temperature scanning tunneling microscopy

Using a low-temperature (1.2K) scanning tunneling microscopy, the tunneling spectra showing the superconducting gap was taken on Pb island structures, whose dimension ranges from 80 to 300nm in diameter and 7–12 monolayers in thickness. There is no considerable spatial variation in the tunneling spectra taken on a single island regardless of local geometry (center or peripheral) and thickness of the measured sites. The superconducting gap increases with the island size, and the size dependence is enhanced at higher temperature (3.9K). The behavior of the gap is explained qualitatively by considering the superconducting fluctuation in the small islands.

Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator.

Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm, which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si(111)-(7x7) surface was successfully obtained.

Improvement of a dynamic scanning force microscope for highest resolution imaging in ultrahigh vacuum

We report on a modification of a commercial scanning force microscope (Omicron UHV AFM/STM) operated in noncontact mode (NC-AFM) at room temperature in ultrahigh vacuum yielding a decrease in the spectral noise density from 2757 to 272 fm/Hz. The major part of the noise reduction is achieved by an exchange of the originally installed light emitting diode by a laser diode placed outside the vacuum, where the light is coupled into the ultrahigh vacuum chamber via an optical fiber. The setup is further improved by the use of preamplifiers having a bandpass characteristics tailored to the cantilever resonance frequency. The enhanced signal to noise ratio is demonstrated by a comparison of atomic resolution images on CeO(2)(111) obtained before and after the modification.