Takehiro Nishimura
Kyocera
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Featured researches published by Takehiro Nishimura.
Applied Physics Letters | 1998
Seiichi Nagata; Chiaki Domoto; Takehiro Nishimura; Kazuaki Iwameji
Metal-organic compound molecules were selectively doped into the larger pores of a two-layered porous silicon (PS) which had different pore sizes. PS with a graded pore-size distribution was area-selectively formed by utilizing a thin film mask. Titanium-organic compound molecules were doped into the larger pores and the PS was oxidized to form an optical waveguide. Single-mode transmission of 1.55 μm wavelength laser light was successfully observed.
Semiconductor Science and Technology | 2004
Naoki Ohtani; Y. Hirose; Takehiro Nishimura; Tahito Aida; M. Hosoda
We report the observation of electric-field domain formation in an asymmetric double-quantum-well GaAs/AlAs superlattice. Photoluminescence (PL) spectra exhibit several branches with increasing bias voltage. These steeply red-shifted PL branches can be attributed to Stark-ladder transitions between the heavy hole ground state in the narrow quantum well and the electron ground state in the wide quantum well in the high-field domain. According to our calculations, electrons and holes in the high-field domain are separated into different quantum wells, resulting in a large reduction of the radiative recombination energy with increasing electric field. Each PL branch most likely corresponds to the moving of the domain boundary.
Japanese Journal of Applied Physics | 2011
Hirotada Inoue; Kouji Tanaka; Yuichi Sano; Takehiro Nishimura; Akinobu Teramoto; Masaki Hirayama; Tadahiro Ohmi
In this study, the deposition of amorphous silicon (a-Si) thin films using a microwave-excited high-density plasma system is described. We investigate the effects of plasma excitation gas species (argon or helium), total gas pressure, silane (SiH4) flow rate, and substrate stage temperature, estimating the resultant films from cross-sectional morphology, photoconductivity, and dark conductivity measured without light-induced degradation. It is confirmed that high-quality a-Si films (photosensitivity= 1.29 ×106) can be formed in the plasma excitation gas helium at a pressure of 13.3 Pa by relatively high rate (1.1 nm/s) deposition. At the same time, we measure the plasma emission derived from various radicals such as Si and SiH radicals in order to discuss the mechanism of radical generation in the plasma. The result of the measurement implies that when argon is used as plasma excitation gas, metastable states of argon markedly dissociate silane, which produces low-quality a-Si films. On the other hand, it seems that electrons dissociate silane mainly, which produces high-quality a-Si films, in helium.
Applied Physics Letters | 2002
Y. Hirose; M. Hosoda; C. Domoto; Takehiro Nishimura; Tahito Aida
We propose an effective method for carrier injection into the high-energy Γ ground state in a narrow quantum well (QW) in asymmetric double QW systems using Γ–X–Γ electron transfer and simultaneous hole tunneling. Although the high-energy state is type-II band-aligned for the electrons, our method enables an efficient injection of both electrons and holes into the same narrow QW, and it thus demonstrates relatively strong light emission from the higher energy state.
Japanese Journal of Applied Physics | 2002
Chiaki Domoto; Takehiro Nishimura; Naoki Ohtani; Kazuyoshi Kuroyanagi; Pablo O. Vaccaro; Tahito Aida; Hideo Takeuchi; Masaaki Nakayama
We report the interband photoluminescence from high Γ-electron subbands and mid-infrared electroluminescence originating from an intersubband transition in a simple GaAs (15.3 nm)/AlAs (4.5 nm) superlattice embedded in a p–i–n structure. Interband photoluminescence properties under applied bias voltages provide conclusive evidence that electrons populate the fourth Γ (Γ4) electron subband in the GaAs layer. This electron population results from the carrier injection into the Γ4 subband from the adjacent X1 subband in the AlAs layer, which is initiated by the X1–Γ4 resonance. We calculate the overlap integral of the envelope functions for Γ-electron and heavy-hole subbands in order to discuss the carrier population in high Γ subbands based on the photoluminescence intensities. The results of analysis suggest that a population inversion can be obtained between the Γ4 and Γ3 subbands under the X1–Γ4 resonant condition. The energy of the intersubband electroluminescence, 100 meV, agrees with the energy spacing between the Γ4 and Γ3 subbands. This demonstrates that the carrier injection into the higher Γ subband using X–Γ scattering will be useful for designing of intersubband-emission devices.
Applied Physics Letters | 2000
C. Domoto; Naoki Ohtani; Kazuyoshi Kuroyanagi; Pablo O. Vaccaro; Hideo Takeuchi; Masaaki Nakayama; Takehiro Nishimura
We report midinfrared electroluminescence originated from an intersubband transition in a GaAs/AlAs superlattice consisting of asymmetric double quantum wells. It is confirmed from interband photoluminescence properties under applied bias voltages that electrons populate at the second Γ (Γ2) subband in the GaAs layer. The electron population results from the carrier injection into the Γ2 subband from the adjacent X1 subband in the AlAs layer, which is initiated by the X1–Γ2 resonance. The energy of the intersubband electroluminescence, 190 meV, agrees with the energy spacing between the Γ2 and Γ1 subbands. This demonstrates that the carrier injection into the higher Γ subband using X–Γ scattering is useful for the design of intersubband-emission devices.
Physical Review E | 2003
Takahisa Harayama; Tekehiro Fukushima; Peter Davis; Pablo O. Vaccaro; Tomohiro Miyasaka; Takehiro Nishimura; Tahito Aida
Archive | 2011
Satoshi Oomae; Shinichi Abe; Masato Fukudome; Takeshi Ookuma; Katsuhiko Shirasawa; Takehiro Nishimura; Daisuke Toyota; Hirotaka Sano; Keita Kurosu
Archive | 2009
Koichiro Niira; Takehiro Nishimura; Norikazu Ito; Shinichiro Inaba
Archive | 2009
Koichiro Niira; Takehiro Nishimura; Norikazu Ito; Shinichiro Inaba