Takeshi Hirose | Researchain

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Featured researches published by Takeshi Hirose.

Archive | 1999

Method and device for measuring film thickness of thin film and method and device for manufacturing thin film device using the same

Takeshi Hirose; Fumiyuki Kanai; Yukio Kenbo; Takanori Ninomiya; Minoru Noguchi; Mineo Nomoto; Yoji Tsuchiyama; 隆典二宮; 洋史土山; 丈師廣瀬; 行雄見坊; 稔野口; 峰生野本; 史幸金井

Archive | 1998

METHOD AND APPARATUS FOR MEASURING THICKNESS OF THIN FILM, AND METHOD AND APPARATUS FOR MANUFACTURING THIN FILM DEVICE USING THE SAME

Takeshi Hirose; Yukio Kenbo; Shunji Maeda; Takanori Ninomiya; Minoru Noguchi; Yoji Tsuchiyama; 隆典二宮; 俊二前田; 洋史土山; 丈師廣瀬; 行雄見坊; 稔野口

Archive | 2007

Method and device for inspecting pattern on hard disk medium

Takeshi Hirose; Masahiro Watanabe; Yasuhiro Yoshitake; 康裕吉武; 丈師廣瀬; 正浩渡辺

Archive | 2003

Thickness measuring method and its instrument, polishing rate calculating method, and cpm processing method and its apparatus

Takeshi Hirose; Mineo Nomoto; Keiya Saitou; Hideaki Sasazawa; 丈師廣瀬; 啓谷斉藤; 秀明笹澤; 峰生野本

Archive | 2002

Method and instrument for measuring film thickness distribution

Takeshi Hirose; Mineo Nomoto; Keiya Saitou; 廣瀬丈師; 斉藤啓谷; 野本峰生

Archive | 2008

PATTERN SHAPE INSPECTION DEVICE, AND METHOD THEREFOR

Takeshi Hirose; Hiroya Saito; Hideaki Sasazawa; 丈師廣瀬; 啓谷斉藤; 秀明笹澤

Archive | 2003

Method for designing and method for manufacturing thin film device, and semiconductor manufacturing apparatus

Toshiyuki Arai; Takeshi Hirose; Takahiko Kawasaki; Mineo Nomoto; 貴彦川崎; 丈師廣瀬; 利行荒井; 峰生野本

Archive | 2002

Measuring method of film thickness and apparatus thereof, manufacturing method of thin-film device using apparatus, and manufacturing apparatus of the apparatus

Takeshi Hirose; Mineo Nomoto; Keiya Saitou; Hideaki Sasazawa; 丈師廣瀬; 啓谷斉藤; 秀明笹澤; 峰生野本

Archive | 2014

Method and apparatus for inspecting thermally assisted magnetic head

Shinichiro Murakami; 真一郎村上; Teruaki Tokutomi; 照明徳冨; Naoya Saito; 尚也齋藤; Takeshi Hirose; 丈師廣瀬; Ke-Bong Chang; 開鋒張; Keisho Kitano; 佳昇北野

Archive | 2012

CANTILEVER OF SCAN PROBE MICROSCOPE, METHOD FOR MANUFACTURING THE SAME, METHOD FOR INSPECTING HEAT-ASSISTED MAGNETIC HEAD ELEMENT, AND DEVICE FOR THE SAME

Ke-Bong Chang; 開鋒張; Takeshi Hirose; 丈師廣瀬; Masahiro Watanabe; 正浩渡辺; Tsuneo Nakagome; 恒夫中込; Shinji Honma; 真司本間; Teruaki Tokutomi; 照明徳冨; Toshihiko Nakada; 俊彦中田; Takehiro Tachizaki; 武弘立▲崎▼

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