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Takuya Hasumi

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Publication

Featured researches published by Takuya Hasumi.

Archive | 2006

Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method

Takuya Hasumi; Masakatsu Suda

Archive | 2006

Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit

Takuya Hasumi; Masakatsu Suda

Archive | 2007

DELAY CIRCUIT, TEST APPARATUS, STORAGE MEDIUM SEMICONDUCTOR CHIP, INITIALIZING CIRCUIT AND INITIALIZING METHOD

Kazuhiro Fujita; Masakatsu Suda; Takuya Hasumi

Archive | 2012

Delay circuit, test apparatus, semiconductor chip, initializing circuit and initializing method

Kazuhiro Fujita; Takuya Hasumi; Masakatsu Suda

Archive | 2008

VARIABLE DELAY CIRCUIT, TESTING APPARATUS, AND ELECTRONIC DEVICE

Takuya Hasumi; Masakatsu Suda; Satoshi Sudou

Archive | 2007

Verzögerungsschaltkreis, Testgerät, Speichermedium, Halbleiterchip, Initialisierungsschaltkreis und Initialisierungsverfahren

Kazuhiro Fujita; Takuya Hasumi; Masakatsu Suda

Archive | 2007

Delay circuit has delaying elements, which delays input signal at delaying value and initialization circuit measures delaying value

Kazuhiro Fujita; Takuya Hasumi; Masakatsu Suda

Archive | 2006

遅延ロックループ回路、タイミング発生器、半導体試験装置、半導体集積回路及び遅延量校正方法

Takuya Hasumi; Masakatsu Suda

Archive | 2006

Load variation correcting circuit for electronic device, has phase comparing circuit controlling power amount so that phase difference between signals that entering and releasing into and from delay circuit coincides with preset time period

Takuya Hasumi; Masakatsu Suda

Archive | 2006

Verzögerungsregelkreisschaltung, Timing-Generator, Halbleitertestgerät, integrierte Halbleiterschaltung und Verzögerungsbetrieg-Kalibrierungsverfahren Delay locked loop circuit, timing generator, semiconductor test equipment, semiconductor integrated circuit and Verzögerungsbetrieg calibration method

Takuya Hasumi; Masakatsu Suda

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Masakatsu Suda

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Kazuhiro Fujita

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Satoshi Sudou

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