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Featured researches published by Tatsuhiko Koide.


Solid State Phenomena | 2018

Fixed Charge Control of Silylated Surface for Stiction-Free Drying with Surface Energy Reduction Process

Tatsuhiko Koide; Shinsuke Kimura; Takashi Kobayashi; Hiroyasu Iimori; Sugita Tomohiko; Katsuhiro Sato; Yoshihiro Ogawa

Recently, a surface energy reduction process (SERP) for stiction-free drying is used for a high aspect pattern structure like shallow trench isolation (STI). The key technology of SERP is trimethylsilyl (TMS) groups termination of the device surface. To explain the electrical influence of TMS groups was found acceptable by measuring the planar capacitor flat-band voltage shift, and the threshold voltage characteristics of 1x-nm node MOS transistors.


Archive | 2008

Method of treating surface of semiconductor substrate

Hiroshi Tomita; Hiroyasu Iimori; Hisashi Okuchi; Tatsuhiko Koide; Linan Ji


Archive | 2010

Method of treating a semiconductor substrate

Hiroshi Tomita; Tatsuhiko Koide; Hisashi Okuchi; Kentaro Shimayama; Hiroyasu Iimori; Linan Ji


Archive | 2010

APPARATUS AND METHOD OF TREATING SURFACE OF SEMICONDUCTOR SUBSTRATE

Yoshihiro Ogawa; Tatsuhiko Koide; Shinsuke Kimura; Hisashi Okuchi; Hiroshi Tomita


Archive | 2010

Surface treatment agent for semiconductor substrate

Hiroyasu Iimori; Linan Ji; Tatsuhiko Koide; Hisashi Oguchi; Kentaro Shimayama; Hiroshi Tomita


Archive | 2010

SUPERCRITICAL DRYING METHOD AND SUPERCRITICAL DRYING APPARATUS

Yukiko Kitajima; Hisashi Okuchi; Hiroshi Tomita; Hidekazu Hayashi; Tatsuhiko Koide


Archive | 2015

SURFACE TREATMENT APPARATUS AND METHOD FOR SEMICONDUCTOR SUBSTRATE

Tatsuhiko Koide; Shinsuke Kimura; Yoshihiro Ogawa; Hisashi Okuchi; Hiroshi Tomita


Archive | 2011

SEMICONDUCTOR SUBSTRATE SURFACE TREATMENT METHOD

Yoshihiro Ogawa; Shinsuke Kimura; Tatsuhiko Koide; Hisashi Okuchi; Hiroshi Tomita


Archive | 2009

Apparatus and method for processing surface of semiconductor substrate

Shinsuke Kimura; Tatsuhiko Koide; Yoshihiro Ogawa; Hisashi Oguchi; Hiroshi Tomita


228th ECS Meeting (October 11-15, 2015) | 2015

Effect of Surface Energy Reduction for Nano-Structure Stiction

Tatsuhiko Koide; Shinsuke Kimura; Hiroyasu Iimori; Tomohiko Sugita; Katsuhiro Sato; Yohei Sato; Yoshihiro Ogawa

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