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Dive into the research topics where Tetsujiro Tsunoda is active.

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Featured researches published by Tetsujiro Tsunoda.


power electronics specialists conference | 1990

Improved 600 and 1200 V IGBT with low turn-off loss and high ruggedness

Tetsujiro Tsunoda; Makoto Hideshima; Masashi Kuwahara; T. Kuramoto; A. Nakagawa

A novel 600 and 1200 V IGBT (insulated-gate bipolar transistor) family has been developed for operation at more than 20 kHz with sufficient ruggedness. It was found that turn-off loss can be reduced by optimizing the n/sup -/ layer thickness as well as the n/sup +/ buffer impurity profile. A thick n/sup -/ layer was found to be an important factor in improving device ruggedness. Turn-off loss was successfully reduced to one-third of that in conventional IGBTs, while a large safe operating area was retained.<<ETX>>


Archive | 1998

Power semiconductor module with a plurality of semiconductor chips

Hidekazu Sugawara; Tetsujiro Tsunoda; Satoshi Nakao


Archive | 1995

Intelligent power device module

Tetsujiro Tsunoda


Archive | 1991

Metal bump type semiconductor device and method for manufacturing the same

Makoto Hideshima; Tetsujiro Tsunoda; Shinjiro Kojima; Masaru Ando


Archive | 1996

Semiconductor device with interconnect substrates

Tetsujiro Tsunoda


Archive | 1992

Method of manufacturing a semiconductor device by forming at least three regions of different lifetimes of carriers at different depths

Akihiko Osawa; Yoshiro Baba; Mitsuhiko Kitagawa; Tetsujiro Tsunoda


Archive | 1990

Composite semiconductor device having function for overcurrent detection

Tetsujiro Tsunoda


Archive | 1990

INSULATED GATE BIPOLAR TRANSISTOR WITH A SHORTENED CARRIER LIFETIME REGION

Makoto Hideshima; Tetsujiro Tsunoda; Masashi Kuwahara; Shingo Yanagida


Archive | 1992

Semiconductor device with overvoltage protective function

Mitsuhiko Kitagawa; Tetsujiro Tsunoda; Akihiko Osawa


Archive | 1994

Method of manufacturing a semiconductor device of an anode short circuit structure

Tetsujiro Tsunoda

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