Tigran Sargsyan

Direct imaging of photoconductivity of solar cells by using a near-field scanning microwave microprobe

A near-field scanning microwave microprobe (NSMM) technique has been used to investigate the photovoltaic effect in solar cells. As the photoconductivity of the n-type silicon layer in the solar cells was varied due to the incident light intensities and the wavelength, we could directly observe the photoconductivity changes inside the solar cells by measuring the change of reflection coefficient S11 of the NSMM at an operating frequency near 4.1 GHz. We also directly imaged the photoconductivity changes by NSMM. Photoconductivity in solar cells is determined from the visualized microwave reflection coefficient changes at the interfaces with high sensitivity.

Investigation of photoconductivity of silicon solar cells by a near-field scanning microwave microscope.

The photovoltaic effect in silicon solar cells were investigated by using a near-field scanning microwave microscope (NSMM) technique by measuring the microwave reflection coefficient at an operating frequency near 4GHz. As the photoconductivity in the solar cells was varied due to the incident light intensities and the wavelength, we could observe the photoconductivity changes at heterojunction interfaces inside the solar cells by measuring the change of reflection coefficient S(11) of the NSMM. By measuring the change of reflection coefficient, we also directly imaged the photoconductivity changes at heterojunction interfaces inside the solar cells.

Visualization of magnetic domains by near-field scanning microwave microscope

A near-field scanning microwave microscope (NSMM) system was used for the investigation of magnetic properties of a hard disk (HD) under an external magnetic field. To demonstrate local microwave characterization of magnetic domains by NSMM, we scanned the HD surface by measuring the microwave reflection coefficient S(11) of the NSMM at an operating frequency near 4.4GHz. The NSMM offers a reliable means for quantitative measurement of magnetic domains with high spatial resolution and sensitivity.

Characterization of magnetic materials using a scanning microwave microprobe

We investigated the electromagnetic properties of metals of iron, nickel, cobalt, aluminum, gold, copper, silver, and permalloy thin films on SiO2 substrates using a near-field microwave microprobe. The electromagnetic properties of metal sheets were estimated by measuring the microwave reflection coefficient S(11) and compared with the theoretical values. We observed the hysteresis behavior of permalloy thin films on SiO2 substrates using a near-field scanning microwave microprobes (NSMM) system. Experimental results are in good agreement with the theoretical model of transmission theory. In order to better characterize the electromagnetic properties of metals and magnetic metals instead of the usual method, we take advantage of the noncontact microprobing evaluation capabilities using a near-field microwave.

Characterization of Alq3 thin films by a near-field microwave microprobe

We observed tris-8-hydroxyquinoline aluminum (Alq3) thin films dependence on substrate heating temperatures by using a near-field microwave microprobe (NFMM) and by optical absorption at wavelengths between 200 and 900 nm. The changes of absorption intensity at different substrate heating temperatures are correlated to the changes in the sheet resistance of Alq3 thin films.

Investigation of CdS thin films by a near-field microwave microprobe

Cadmium sulphide (CdS) thin films with different microstructures and morphologies were measured by using a near-field microwave microprobe (NFMM). The NFMM system was coupled to a dielectric resonator with a distance regulation system at an operating frequency f=4.1 GHz. The changes in dielectric permittivity of CdS thin films due to different annealing temperatures were investigated by measuring the reflection coefficient S(11). CdS thin films with different microstructures and morphology were characterized by X-ray diffraction, atomic force microscopy and NFMM.