Tobias Liese
University of Göttingen
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Publication
Featured researches published by Tobias Liese.
Optics Express | 2013
Florian Döring; Anna-Lena Robisch; Christian Eberl; Markus Osterhoff; A. Ruhlandt; Tobias Liese; Felix Schlenkrich; Sarah Hoffmann; Matthias Bartels; Tim Salditt; Hans-Ulrich Krebs
Compound optics such as lens systems can overcome the limitations concerning resolution, efficiency, or aberrations which fabrication constraints would impose on any single optical element. In this work we demonstrate unprecedented sub-5 nm point focusing of hard x-rays, based on the combination of a high gain Kirkpatrick-Baez (KB) mirror system and a high resolution W/Si multilayer zone plate (MZP) for ultra-short focal length f. The pre-focusing allows limiting the MZP radius to below 2 μm, compatible with the required 5 nm structure width and essentially unlimited aspect ratios, provided by enabling fabrication technology based on pulsed laser deposition (PLD) and focused ion beam (FIB).
Journal of Applied Physics | 2010
Johanna Röder; Tobias Liese; Hans-Ulrich Krebs
Any kind of processing of materials like thin film deposition, ion beam treatment or polishing often creates structures, which have lateral length scales of 20–200 nm. For many applications an efficient smoothing of such roughened surfaces is needed. To study smoothing on this length-scale, in this work periodic rippled structures with wavelengths of 55 nm and an average height of 4.5 nm were systematically covered by thin films of different material classes by pulsed laser deposition. All materials used possess a low intrinsic roughness on smooth substrates. As studied by atomic force microscopy, the surface roughness is continuously smoothed out with increasing layer thickness. In all cases, the whole process is strongly frequency dependent as expected from theoretical predictions. The dominant smoothing mechanisms have been identified as surface diffusion for small structures below a critical lateral size and sputter erosion or downhill currents for larger structures.
Proceedings of SPIE | 2013
Markus Osterhoff; Matthias Bartels; Florian Döring; Christian Eberl; Thomas Hoinkes; Sarah Hoffmann; Tobias Liese; Volker Radisch; Anna-Lena Robisch; A. Ruhlandt; Felix Schlenkrich; Tim Salditt; Hans-Ulrich Krebs
We present experiments carried out using a combined hard x-ray focusing set-up preserving the benefits of a large-aperture Kirckpatrick-Baez (KB) mirror system and a small focal length multilayer zone plane (MZP). The high gain KB mirrors produce a pre-focus of 400 nm × 200 nm; in their defocus, two MZP lenses of diameter of 1.6 μm and 3.7 μm have been placed, with focal lengths of 50 μm and 250 μm respectively. The lenses have been produced using pulsed laser deposition (PLD) and focused ion beam (FIB). Forward simulations including error models based on measured deviations, auto-correlation analysis and three-plane phase reconstruction support two-dimensional focus sizes of 4.3 nm × 4.7 nm (7:9 keV, W/Si)1 and 4.3 nm ×5.9 nm (13:8 keV, W/ZrO2), respectively.
Review of Scientific Instruments | 2010
Tobias Liese; Volker Radisch; Hans-Ulrich Krebs
AIP Advances | 2012
A. Ruhlandt; Tobias Liese; Volker Radisch; S. P. Krüger; Markus Osterhoff; K. Giewekemeyer; Hans-Ulrich Krebs; Tim Salditt
Applied Surface Science | 2011
Tobias Liese; Volker Radisch; Inga Knorr; Michael Reese; Peter Großmann; Klaus Mann; Hans-Ulrich Krebs
Applied Physics A | 2013
Christian Eberl; Tobias Liese; Felix Schlenkrich; Florian Döring; H. Hofsäss; Hans-Ulrich Krebs
Applied Surface Science | 2014
Christian Eberl; Florian Döring; Tobias Liese; Felix Schlenkrich; Burkhard Roos; Matthias Hahn; Thomas Hoinkes; Markus Osterhoff; Tim Salditt; Hans-Ulrich Krebs
Scripta Materialia | 2016
Andreas Kelling; K. R. Mangipudi; Inga Knorr; Tobias Liese; Hans-Ulrich Krebs; Cynthia A. Volkert
Physical Review B | 2011
Felix Büttner; K. Zhang; Susanne Seyffarth; Tobias Liese; Hans-Ulrich Krebs; C. A. F. Vaz; H. Hofsäss