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Dive into the research topics where Tomoko Hosokawa is active.

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Featured researches published by Tomoko Hosokawa.


Applied Physics Letters | 2004

Fabrication of ambipolar field-effect transistor device with heterostructure of C60 and pentacene

Eiji Kuwahara; Yoshihiro Kubozono; Tomoko Hosokawa; Takayuki Nagano; Kosuke Masunari; Akihiko Fujiwara

Ambipolar field-effect transistor (FET) device was fabricated with heterostructure of thin films of C60 and pentacene. Three types of device structures in the C60∕pentacene heterostructure FET device were studied in order to realize the best ambipolar properties. In the middle-contact type FET device of C60 and pentacene, the mobility μ in p-channel operation was estimated to be 6.8×10−2cm2V−1s−1, while the μ in n-channel operation was 1.3×10−3cm2V−1s−1. This ambipolar FET device is available for a practical building-block to form CMOS integrated circuits with low-power consumption, good-noise margins, and ease of design.


Applied Physics Letters | 2004

Fabrication and characteristics of C84 fullerene field-effect transistors

K. Shibata; Yoshihiro Kubozono; T. Kanbara; Tomoko Hosokawa; Akihiko Fujiwara; Yasuhiro Ito; Hisanori Shinohara

Fullerene field-effect transistors (FETs) were fabricated with thin films of C84, which showed n-channel normally-on depletion-type FET characteristics. The C84 FET device exhibited the highest mobility, μ, of 2.1×10−3 cm2 V−1 s−1 among normally-on fullerene FETs. The carrier transport of this FET device can be interpreted as thermally activated hopping transport. Carrier type (n-channel) and transport mechanism (hopping) reflect the electronic properties of the C84 molecule.


Physical Review B | 2004

Structure and transport properties of isomer-separated C82

Yoshihiro Kubozono; Y. Rikiishi; K. Shibata; Tomoko Hosokawa; S. Fujiki; Hiroshi Kitagawa


Physical Review B | 2003

Structural and electronic properties of Ce @ C 82

K. Shibata; Y. Rikiishi; Tomoko Hosokawa; Y. Haruyama; Yoshihiro Kubozono; Kashino; T. Uruga; Akihiko Fujiwara; Hiroshi Kitagawa; Takano; Yoshihiro Iwasa


Journal of Physical Chemistry B | 2004

Structural and electronic characterizations of two isomers of Ce@C82

Y. Rikiishi; Yoshihiro Kubozono; Tomoko Hosokawa; K. Shibata; Y. Haruyama; Yasuhiro Takabayashi; Akihiko Fujiwara; Shin-ichiro Kobayashi; Satoshi Mori; Yoshihiro Iwasa


Physical Review B | 2004

Scanning tunneling microscopy of Dy@C82 and Dy@C60 adsorbed on Si(111)-(7x7) surfaces

S. Fujiki; Yoshihiro Kubozono; Tomoko Hosokawa; Takayoshi Kanbara; Akihiko Fujiwara; Youichi Nonogaki; Tsuneo Urisu


Chemical Physics Letters | 2004

Electronic properties for the C2v and Cs isomers of Pr@C82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy

Tomoko Hosokawa; S. Fujiki; Eiji Kuwahara; Yoshihiro Kubozono; Hiroshi Kitagawa; Akihiko Fujiwara; Taishi Takenobu; Yoshihiro Iwasa


Physical Review B | 2002

Pressure and temperature dependences of the structural properties of Dy@C82 isomer I

Yasuhiro Takabayashi; Yoshihiro Kubozono; T. Kanbara; S. Fujiki; K. Shibata; Y. Haruyama; Tomoko Hosokawa; Y. Rikiishi; Setsuo Kashino


Chemical Physics Letters | 2004

Preferred location of the Dy ion in the minor isomer of Dy@C82 determined by Dy LIII-edge EXAFS

Yasuhiro Takabayashi; Y. Haruyama; Y. Rikiishi; Tomoko Hosokawa; K. Shibata; Yoshihiro Kubozono


Physical Review B | 2003

Structural and electronic properties of Ce@C82

K. Shibata; Y. Rikiishi; Tomoko Hosokawa; Y. Haruyama; Yoshihiro Kubozono; Setsuo Kashino; Tomoya Uruga; Akihiko Fujiwara; Hiroshi Kitagawa; T. Takano; Yoshihiro Iwasa

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Akihiko Fujiwara

Japan Advanced Institute of Science and Technology

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S. Fujiki

Graduate University for Advanced Studies

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