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Featured researches published by Toshiaki Adachi.


international test conference | 2004

Test programming environment in a modular, open architecture test system

Ankan Pramanick; R. Krishnaswamy; Mark Elston; Toshiaki Adachi; Harsanjeet Singh; B. Parnas; Leon Chen

This work addresses two key concepts in device test program development: test class programming and pattern management. These are explored in the context of an open architecture test system, where the primary requirement is the flexibility to integrate externally developed capabilities into the system. Development against an open architecture test system includes the integration of software-based solutions (such as user-developed test classes) and third party hardware modules, including the software necessary to support the modules. This work focuses on the open architecture facets of test programming and pattern management, as embodied in the OPENSTAR/spl trade/ specification. The software for Advantest Corporations T2000 system is used as a concrete example for highlighting these concepts.


international test conference | 2005

Parallel, multi-DUT testing in an open architecture test system

Toshiaki Adachi; Ankan Pramanick; Mark Elston

Parallel testing provides an increase in throughput without a corresponding increase in cost, by performing tests on multiple devices under test at the same time. Addition of this capability to a modular, re-configurable, open architecture test system paves the way for an even more cost-effective solution. This paper describes the parallel test strategy adopted in the T2000 tester from Advantest Corporation, which is based on the OPENSTARtrade platform


european test symposium | 2004

Software development for an open architecture test system

Bruce R. Parnas; Ankan Pramanick; Mark Elston; Toshiaki Adachi

An open architecture test system is one that allows the seamless integration of externally developed capabilities. These capabilities include both software-only solutions as well as third party hardware modules, and the software required to support them. This paper will address the topic of developing software against an open architecture test system. This will encompass both the software-only and hardware support facets of the development effort. The notion of interface-based programming as a means to achieve this goal will be presented. A set of required pieces will be defined for both of these development activities. The OPENSTAR? system will be used as a vehicle to motivate the discussion with a concrete example.


Archive | 2004

Method and structure to develop a test program for semiconductor integrated circuits

Harsanjeet Singh; Ankan Pramanick; Mark Elston; Leon Chen; Toshiaki Adachi; Yoshihumi Tahara


Archive | 2007

Test emulator, test module emulator, and record medium storing program therein

Shinsaku Higashi; Seiji Ichiyoshi; Ankan Pramanick; Mark Elston; Leon Chen; Robert Sauer; Harsanjeet Singh; Toshiaki Adachi; Yoshihumi Tahara


Archive | 2004

Method and system for controlling interchangeable components in a modular test system

Ankan Pramanick; Mark Elston; Toshiaki Adachi


Archive | 2005

Method and system for scheduling tests in a parallel test system

Ankan Pramanick; Toshiaki Adachi; Mark Elston


Archive | 2005

Method and system for performing installation and configuration management of tester instrument modules

Ankan Pramanick; Jim Hanrahan; Mark Elston; Toshiaki Adachi; Leon Chen


Archive | 2004

Method and system for simulating a modular test system

Conrad Mukai; Ankan Pramanick; Mark Elston; Toshiaki Adachi; Leon Chen


Archive | 2007

TEST EQUIPMENT, METHOD FOR LOADING TEST PLAN AND PROGRAM PRODUCT

Toshiaki Adachi

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