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Dive into the research topics where Ankan Pramanick is active.

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Featured researches published by Ankan Pramanick.


international test conference | 2004

Test programming environment in a modular, open architecture test system

Ankan Pramanick; R. Krishnaswamy; Mark Elston; Toshiaki Adachi; Harsanjeet Singh; B. Parnas; Leon Chen

This work addresses two key concepts in device test program development: test class programming and pattern management. These are explored in the context of an open architecture test system, where the primary requirement is the flexibility to integrate externally developed capabilities into the system. Development against an open architecture test system includes the integration of software-based solutions (such as user-developed test classes) and third party hardware modules, including the software necessary to support the modules. This work focuses on the open architecture facets of test programming and pattern management, as embodied in the OPENSTAR/spl trade/ specification. The software for Advantest Corporations T2000 system is used as a concrete example for highlighting these concepts.


Archive | 2004

Method and structure to develop a test program for semiconductor integrated circuits

Harsanjeet Singh; Ankan Pramanick; Mark Elston; Leon Chen; Toshiaki Adachi; Yoshihumi Tahara


Archive | 2004

Method and apparatus for testing integrated circuits

Ankan Pramanick; Mark Elston; Leon Chen; Robert Sauer


Archive | 2007

Test emulator, test module emulator, and record medium storing program therein

Shinsaku Higashi; Seiji Ichiyoshi; Ankan Pramanick; Mark Elston; Leon Chen; Robert Sauer; Harsanjeet Singh; Toshiaki Adachi; Yoshihumi Tahara


Archive | 2004

Method and system for controlling interchangeable components in a modular test system

Ankan Pramanick; Mark Elston; Toshiaki Adachi


Archive | 2005

Method and system for scheduling tests in a parallel test system

Ankan Pramanick; Toshiaki Adachi; Mark Elston


Archive | 2005

Method and system for performing installation and configuration management of tester instrument modules

Ankan Pramanick; Jim Hanrahan; Mark Elston; Toshiaki Adachi; Leon Chen


Archive | 2003

Event based test method for debugging timing related failures in integrated circuits

Ankan Pramanick; Siddharth Sawe; Rochit Rajsuman


Archive | 2005

Compact representation of vendor hardware module revisions in an open architecture test system

Ankan Pramanick; Mark Elston; Toshiaki Adachi


Archive | 2014

Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing

Mark Elston; Leon Chen; Harsanjeet Singh; Hironori Maeda; Ankan Pramanick; Youbi Katsu

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